Dr Chris Jeynes

Senior Research Staff

Qualifications: BSc, MSc, PhD, MInstP, CPhys, CEng

Email:
Phone: Work: 01483 68 9829
Room no: 01 WT 02

Further information

Biography

PhD: "Carbonado and the diamond polishing process", Department of Physics,  University of Bristol, 1981 with Andrew Lang (now Prof.A.R.Lang FRS).  See:  C.Jeynes,  A proposed diamond polishing process, Phil.Mag. A42 (1983) 169-197 and C.Jeynes,  Natural polycrystalline diamond,  Industrial Diamond Review, 39  (1978) 14-23

1981:  Joined University of Surrey to work on epitaxial silicon deposition with Ian Wilson.  See:  M.Milosavljević, C.Jeyens (sic), I.H.Wilson,  Low-temperature epitaxial growth of (100) silicon,  Elec.Letts. 19 (1983) 669-671, M Milosavljević,  C Jeynes,  I H Wilson, Solid phase epitaxy of evaporated amorphous silicon films, Appl. Phys. Lett. 45 (8) 874-876 (1984), M Milosavljević,  C Jeynes,  I H Wilson, Epitaxial (100) silicon films grown at low temperatures in an electron-beam evaporator, J. Appl. Phys.  57 1252-1255 (1985)48 (2): 169-197 1983

1982:  Joined the University of Surrey Ion Beam Centre as Liaison Fellow

1989:  Promoted to Senior Liaison Fellow

Research Interests

Accurate Ion Beam Analysis

I have long believed that we do not generally get as much information from IBA spectra as we could.  Our first contribution to more detailed RBS analysis was a code to fit joined half-Gaussians (JHG) to data  (C Jeynes,  A C Kimber, High accuracy data from Rutherford backscattering spectra: Measurements of the range and straggling of 60-400 keV As implants into Si, J. Phys. D. 18,  L93-L97 (1985);  A C Kimber,  C Jeynes, An application of the truncated two-piece normal distribution to the measurement of depths of arsenic implants in silicon. J. Roy. Stat. Soc. C, 36(3) 352-357 (1987)).

There were a number of useful application of this JHG code:  U Bangert,  P J Goodhew,  C Jeynes,  I H Wilson, Low energy (2-5 keV) argon damage in silicon, J. Physics. D. 19 (1986) 589-603;  R P Webb,  C Jeynes,  I H Wilson, The effect of angle of incidence on interface broadening, Nucl. Instrum. Methods B,13 (1986) 449-452; Z.H.Jafri, C.Jeynes, R.P.Webb, I.H.Wilson, Observation of swelling and sputtering of a Si target under Ar ion irradiation using a double marker technique, Vacuum 39 (1989) 1119-21;  Z.H.Jafri, C.Jeynes, R.P.Webb, I.H.Wilson, Mass transport of Silicon during Argon irradiation employing a double marker system, Nucl. Instrum. Methods B, 48  (1990) 457-460.

I have also used this JHG code participating in a Round Robin to use RBS to measure the thickness of Ta2O5 layers on Ta organised by Martin Seah of the National Physical Laboratory:  M P Seah,  D David,  J A Davies,  C Jeynes,  C Ortega,  C Sofield,  G Weber, An intercomparison of absolute measurements of the oxygen and tantalum thickness of Ta2O5 reference materials BCR 261 by Six laboratories, Nucl. Instrum. Methods B, 30 (1988) 140-51.

We were the first to critically demonstrate 1% absolute accuracy in determining the stoichiometry of InGaAs films by RBS:  C.Jeynes, Z.H.Jafri, R.P.Webb, M.J.Ashwin,  A.C.Kimber, Accurate RBS measurements of the In content of InGaAs thin films,  Surf.Interface Anal. 25 (1997) 254-260. 

We have critically demonstrated that, with care, the electronic gain of the spectroscopy system for standard He RBS can be determined to 0.5%:  C.Jeynes,  N.P.Barradas,  M.J.Blewett,  R.P.Webb, Improved ion beam analysis facilities at the University of Surrey,  Nucl. Instrum. Methods B, 136-138 (1998) 1229-1234.  It is surprising that in fact it is pretty difficult to get better than this;  for example,  Lennard (et al, Nucl. Instrum. Methods B, 45, 1990, 281) in his work on the pulse height deficit of detectors implicitly gets the same accuracy.  With considerable effort we have achieved <0.1% (see A.F.Gurbich, C.Jeynes,  Evaluation of non-Rutherford proton elastic scattering cross-section for magnesium, Nucl. Instrum. Methods B, 265, 2007, 447–452);  a comparable accuracy has also been acheived by Munnik et al (Nucl. Instrum. Methods B, 119, 1996, 445).

We have also demonstrated ion implantation fluence determination by RBS at 2% absolute traceable accuracy,  where the uncertainty is dominated by that in the silicon stopping power,  used for a robust and convenient routine determination of the charge solid-angle product (Jeynes et al,  Quality assurance in an implantation laboratory by high accuracy RBS,  Nucl. Instrum. Methods B, 249, 2006, 482).  A measurement precision of 0.5% has been demonstrated in this work.

This has been followed up by a "Round Robin" between Surrey (Jeynes),  Lisbon (Barradas) and Budapest (Szilágyi) demonstrating that three labs can independently measure an implant fluence with an absolute accuracy of 1% ("Accurate determination of Quantity of Material in thin films by Rutherford backscattering spectrometry",  accepted by Analytical Chemistry 2nd May 2012).

The IBA DataFurnace

Really,  this is a continuation of the "Accurate IBA" theme.  Nuno Barradas and I (with support from Roger Webb) invented the DataFurnace in 1997 as an automated way of getting depth profiles out of "hard" RBS spectra.  We were the first to use the simulated annealing algorithm to do this,  and no-one to date can invert IBA spectra as easily, robustly and accurately as we can.  

We first published this work as: N.P.Barradas,  C.Jeynes,  R.P.Webb, Simulated annealing analysis of Rutherford backscattering data, Appl.Phys.Lett. 71 (1997) 291-3.
There is now a large literature on DataFurnace and a full-length Topical Review has been published (C.Jeynes et al  J.Phys.D 36, 2003, R97-R126).  See the DataFurnace web pages.

IBA Reviews

C.Jeynes,  R.P.Webb,  A.Lohstroh,  Ion Beam Analysis : a century of exploiting the electronic and nuclear structure of the atom for materials characterisation,  Reviews of Accelerator Science and Technology Vol. 4, (2011) 41-82 (World Scientific Publishing Company) 31 Figs., 290 refs.

C.Jeynes, M.J.Bailey, N.J.Bright, M.E.Christopher, G.W.Grime, B.N.Jones, V.V.Palitsin, R.P.Webb,  "Total IBA" – where are we?  Nucl. Instr. Methods B, 271 (2012) 107-118 (a version of an invited talk given at the 20th International Conference for Ion Beam Analysis,  Itapema, Brazil, 10-15 April, 2011) 123 refs.


Research Collaborations

With Nuno Barradas (ITN, Lisbon),  creating and maintaining the DataFurnace code

Publications

Highlights

  • Jeynes C, Barradas NP. (2009) Pitfalls in Ion Beam Analysis. in Wang Y, Nastasi MA (eds.) Handbook of Modern Ion Beam Materials Analysis 2nd Edition. Warrendale Pennsylvania : Materials Research Society Article number 15 , pp. 347-383.
    Full text is available at: http://epubs.surrey.ac.uk/715433/

    Abstract

    Accurate elemental depth profiling by IBA is of great value to many modern thin-film technologies. IBA is a quantitative analytical technique now capable of traceable accuracy below 1%. In this chapter we describe sources of errors in data collection and analysis (pitfalls) greater than about 1/4%.

  • Bailey MJ, Coe S, Grant DM, Grime GW, Jeynes C. (2009) 'Accurate determination of the Ca : P ratio in rough hydroxyapatite samples by SEM-EDS, PIXE and RBS - a comparative study'. JOHN WILEY & SONS LTD X-RAY SPECTROMETRY, Cavtat, CROATIA: 38 (4), pp. 343-347.
    doi: 10.1002/xrs.1171
  • Bailey MJ, Howard KT, Kirkby KJ, Jeynes C. (2009) 'Characterisation of inhomogeneous inclusions in Darwin glass using ion beam analysis'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Debrecen, HUNGARY: 267 (12-13), pp. 2219-2224.
    doi: 10.1016/j.nimb.2009.03.013
  • Beck L, Jeynes C, Barradas NP. (2008) 'Characterization of paint layers by simultaneous self-consistent fitting of RBS/PIXE spectra using simulated annealing'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Hyderabad, Sch Phys, Hyderabad, INDIA: 266 (8), pp. 1871-1874.
    doi: 10.1016/j.nimb.2007.12.091
  • Barradas NP, Arstila K, Battistig G, Bianconi M, Dytlewski N, Jeynes C, Kotai E, Lulli G, Mayer M, Rauhala E, Szilagyi E, Thompson M. (2008) 'Summary of "IAEA intercomparison of IBA software"'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Hyderabad, Sch Phys, Hyderabad, INDIA: 18th International Conference on Ion Beam Analysis 266 (8), pp. 1338-1342.
    doi: 10.1016/j.nimb.2007.10.043
    Full text is available at: http://epubs.surrey.ac.uk/722449/
  • Gurbich AF, Jeynes C. (2007) 'Evaluation of non-Rutherford proton elastic scattering cross-section for magnesium'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 265 (2), pp. 447-452.
    doi: 10.1016/j.nimb.2007.07.025
  • Barradas NP, Arstila K, Battistig G, Bianconi M, Dytlewski N, Jeynes C, Kotai E, Lulli G, Mayer M, Rauhala E, Szilagyi E, Thompson M. (2007) 'International Atomic Energy Agency intercomparison of ion beam analysis software'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 262 (2), pp. 281-303.
    doi: 10.1016/j.nimb.2007.05.018
  • Pascual-Izarra C, Barradas NP, Reis MA, Jeynes C, Menu M, Lavedrine B, Jacques Ezrati J, Roehrs S. (2007) 'Towards truly simultaneous PIXE and RBS analysis of layered objects in cultural heritage'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Ft Worth, TX: 261 (1-2), pp. 426-429.
    doi: 10.1016/j.nimb.2007.04.259

Journal articles

  • Milosavljević M, Obradović M, Grce A, Peruško D, Pjević D, Kovač J, Dražič G, Jeynes C. (2013) 'High dose ion irradiation effects on immiscible AlN/TiN nano-scaled multilayers'. Thin Solid Films,
    doi: 10.1016/j.tsf.2012.12.068
  • Wakeling BR, Degamber B, Kister G, Lane DW, Bailey MJ, Jeynes C. (2012) 'In situ analysis of cadmium sulphide chemical bath deposition by an optical fibre monitor'. Thin Solid Films, 525, pp. 1-5.
    doi: 10.1016/j.tsf.2012.07.109
  • Berhanuddin DD, Lourenço MA, Jeynes C, Milosavljević M, Gwilliam RM, Homewood KP. (2012) 'Structural analysis of silicon co-implanted with carbon and high energy proton for the formation of the lasing G-centre'. Journal of Applied Physics, 112 (10)
    doi: 10.1063/1.4766390
  • Jeynes C, Bailey MJ, Bright NJ, Christopher ME, Grime GW, Jones BN, Palitsin VV, Webb RP. (2012) '"total IBA" - Where are we?'. Elsevier Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 271, pp. 107-118.
    doi: 10.1016/j.nimb.2011.09.020
    Full text is available at: http://epubs.surrey.ac.uk/715435/

    Abstract

    The suite of techniques which are available with the small accelerators used for MeV ion beam analysis (IBA) range from broad beams, microbeams or external beams using the various particle and photon spectrometries (including RBS, EBS, ERD, STIM, PIXE, PIGE, NRA and their variants), to tomography and secondary particle spectrometries like MeV-SIMS. These can potentially yield almost everything there is to know about the 3-D elemental composition of types of samples that have always been hard to analyse, given the sensitivity and the spacial resolution of the techniques used. Molecular and chemical information is available in principle with, respectively, MeV-SIMS and high resolution PIXE. However, these techniques separately give only partial information – the secret of “Total IBA” is to find synergies between techniques used simultaneously which efficiently give extra information. We here review how far “Total IBA” can be considered already a reality, and what further needs to be done to realise its full potential.

  • Shtereva KS, Novotny I, Tvarozek V, Vojs M, Flickyngerova S, Sutta P, Vincze A, Milosavljević M, Jeynes C, Peng N. (2012) 'Carrier Control in Polycrystalline ZnO:Ga Thin Films via Nitrogen Implantation Electronic Materials and Processing'. The Electrochemical Society ECS Journal of Solid State Science and Technology, 1 (5), pp. 237-240.
    doi: 10.1149/2.003206jss
    Full text is available at: http://epubs.surrey.ac.uk/742121/

    Abstract

    The electrical characteristics of gallium-doped zinc oxide (ZnO:Ga) thin films prepared by rf diode sputtering were altered via nitrogen implantation by performing two implants at 40 keV and 80 keV with doses of 1×1015 and 1×1016 cm−2 to achieve a p-type semiconductor. An implantation of 1×1015 cm−2 N+-ions yielded a p-type with hole concentrations 1017–1018 cm−3 in some as-implanted samples. The films annealed at temperatures above 200°C in O2 and above 400°C in N2 were n-type with electron concentrations 1017–1020 cm−3. The higher nitrogen concentration (confirmed by SRIM and SIMS), in the films implanted with a 1×1016 cm−2 dose, resulted in lower electron concentrations, respectively, higher resistivity, due to compensation of donors by nitrogen acceptors. The electron concentrations ratio n(1×1015)/n(1×1016) decreases with increasing annealing temperature. Hall measurements showed that 1×1016 cm−2 N-implanted films became p-type after low temperature annealing in O2 at 200°C and in N2 at 400°C with hole concentrations of 3.2×1017 cm−3 and 1.6×1019 cm−3, respectively. Nitrogen-implanted ZnO:Ga films showed a c-axes preferred orientation of the crystallites. Annealing is shown to increase the average transmittance (>80%) of the films and to cause bandgap widening (3.19–3.3 eV).

  • Jeynes C, Barradas NP, Szilágyi E. (2012) 'Accurate determination of quantity of material in thin films by Rutherford backscattering spectrometry'. Analytical Chemistry, 84 (14), pp. 6061-6069.
    doi: 10.1021/ac300904c
  • Antwis L, Gwilliam R, Smith A, Jeynes C, Homewood K. (2012) 'Characterization of a-FeSi /c-Si heterojunctions for photovoltaic applications'. Semiconductor Science and Technology, 27 (3)
    doi: 10.1088/0268-1242/27/3/035016
  • Guan W, Ghatak J, Peng Y, Peng N, Jeynes C, Inkson B, Moebus G. (2012) 'Patterned ion beam implantation of Co ions into a SiO2 thin film via ordered nanoporous alumina masks'. NANOTECHNOLOGY, 23 (4) Article number ARTN 045605
    doi: 10.1088/0957-4484/23/4/045605
  • Milosavljevic M, Stojanovic N, Perusko D, Timotijevic B, Toprek D, Kovac J, Drazic G, Jeynes C. (2012) 'Ion irradiation induced Al-Ti interaction in nano-scaled Al/Ti multilayers'. APPLIED SURFACE SCIENCE, 258 (6), pp. 2043-2046.
    doi: 10.1016/j.apsusc.2011.04.107
  • Wakeling BR, Degamber B, Kister G, Lane DW, Bailey MJ, Jeynes C. (2012) 'In situ analysis of cadmium sulphide chemical bath deposition by an optical fibre monitor'. Thin Solid Films,
    doi: 10.1016/j.tsf.2012.07.109
  • Jeynes C, Webb RP, Lohstroh A. (2011) 'Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation'. World Scientific Reviews of Accelerator Science and Technology, 4, pp. 41-82.
    doi: 10.1142/S1793626811000483
  • Gilbert M, Davoisne C, Stennett MC, Hyatt NC, Peng N, Jeynes C, Lee WE. (2011) 'Krypton and helium irradiation damage in yttria-stabilised zirconia'. Materials Research Society Materials Research Society Symposium Proceedings, 1298, pp. 197-202.
    doi: 10.1557/opl.2011.50
    Full text is available at: http://epubs.surrey.ac.uk/7880/
  • Khamsuwan J, Intarasiri S, Kirkby K, Jeynes C, Chu PK, Kamwanna T, Yu LD. (2011) 'High-energy heavy ion beam annealing effect on ion beam synthesis of silicon carbide'. Elsevier Surface and Coatings Technology, 206 (5), pp. 770-774.
    doi: 10.1016/j.surfcoat.2011.04.058
  • Gurbich AF, Abriola D, Barradas NP, Ramos AR, Bogdanovic-Radovic I, Chiari M, Jeynes C, Kokkoris M, Mayer M, Shi L, Vickridge I. (2011) 'Measurements and Evaluation of Differential Cross-sections for Ion Beam Analysis'. JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 59 (2), pp. 2010-2013.
    doi: 10.3938/jkps.59.2010
  • Davoisne C, Stennett MC, Hyatt NC, Peng N, Jeynes C, Lee WE. (2011) 'Krypton irradiation damage in Nd-doped zirconolite and perovskite'. Journal of Nuclear Materials, 415 (1), pp. 67-73.
    doi: 10.1016/j.jnucmat.2011.05.043
  • Abriola D, Barradas NP, Bogdanović-Radović I, Chiari M, Gurbich AF, Jeynes C, Kokkoris M, Mayer M, Ramos AR, Shi L, Vickridge I. (2011) 'Development of a reference database for Ion Beam Analysis and future perspectives'. Elsevier Nuclear Instruments and Methods in Physics Research B, 269 (24), pp. 2972-2978.
    doi: 10.1016/j.nimb.2011.04.056
  • Kaabar W, Daar E, Bunk O, Farquharson MJ, Laklouk A, Bailey M, Jeynes C, Gundogdu O, Bradley DA. (2011) 'Elemental and structural studies at the bonecartilage interface'. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 652 (1), pp. 786-790.
    doi: 10.1016/j.nima.2010.09.095
  • Gilbert M, Davoisne C, Stennett M, Hyatt N, Peng N, Jeynes C, Lee WE. (2011) 'Krypton and helium irradiation damage in neodymium-zirconolite'. Elsevier Journal of Nuclear Materials, 416 (1-2), pp. 221-224.
    doi: 10.1016/j.jnucmat.2010.11.089
  • Olofinjana B, Egharevba GO, Eleruja MA, Jeynes C, Adedeji AV, Akinwunmi OO, Taleatu BA, Mordi CU, Ajayi EOB. (2010) 'Synthesis and Some Properties of Metal Organic Chemical Vapour Deposited Molybdenum Oxysulphide Thin Films'. JOURNAL MATER SCI TECHNOL J MATER SCI TECHNOL, 26 (6), pp. 552-557.
    doi: 10.1016/S1005-0302(10)60084-9
  • Milosavljevic M, Perusko D, Milinovic V, Stojanovic Z, Zalar A, Kovac J, Jeynes C. (2010) 'Ion irradiation stability of multilayered AlN/TiN nanocomposites'. IOP PUBLISHING LTD JOURNAL OF PHYSICS D-APPLIED PHYSICS, 43 (6) Article number ARTN 065302
    doi: 10.1088/0022-3727/43/6/065302
  • Kaabar W, Daar E, Bunk O, Farquharson MJ, Laklouk A, Bailey M, Jeynes C, Gundogdu O, Bradley DA. (2010) 'Elemental and structural studies at the bone-cartilage interface'. Elsevier Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 652 (1), pp. 786-790.
    doi: 10.1016/j.nima.2010.09.095
  • Davoisne C, Lee WE, Stennett MC, Hyatt NC, Peng N, Jeynes C. (2010) 'Irradiation effects in ceramics for plutonium disposition'. Ceramic Transactions, 222, pp. 3-9.
    doi: 10.1002/9780470930991.ch1
  • Loiacono R, Reed GT, Gwilliam R, Mashanovich GZ, O'Faolain L, Krauss T, Lulli G, Jeynes C, Jones R, Kubby JA, Reed GT. (2010) 'Germanium implanted Bragg gratings in Silicon on Insulator waveguides'. SPIE-INT SOC OPTICAL ENGINEERING SILICON PHOTONICS V, San Francisco, CA: 7606 Article number ARTN 76060G
    doi: 10.1117/12.839502
  • Bailey MJ, Coe S, Grant DM, Grime GW, Jeynes C. (2009) 'Accurate determination of the Ca : P ratio in rough hydroxyapatite samples by SEM-EDS, PIXE and RBS - a comparative study'. JOHN WILEY & SONS LTD X-RAY SPECTROMETRY, Cavtat, CROATIA: 38 (4), pp. 343-347.
    doi: 10.1002/xrs.1171
  • Bailey MJ, Jeynes C. (2009) 'Characterisation of gunshot residue particles using self-consistent ion beam analysis'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Debrecen, HUNGARY: 267 (12-13), pp. 2265-2268.
    doi: 10.1016/j.nimb.2009.03.031
  • Bailey MJ, Howard KT, Kirkby KJ, Jeynes C. (2009) 'Characterisation of inhomogeneous inclusions in Darwin glass using ion beam analysis'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Debrecen, HUNGARY: 267 (12-13), pp. 2219-2224.
    doi: 10.1016/j.nimb.2009.03.013
  • Hashim S, Al-Ahbabi S, Bradley DA, Webb M, Jeynes C, Ramli AT, Wagiran H. (2009) 'The thermoluminescence response of doped SiO2 optical fibres subjected to photon and electron irradiations'. PERGAMON-ELSEVIER SCIENCE LTD APPLIED RADIATION AND ISOTOPES, 67 (3), pp. 423-427.
    doi: 10.1016/j.apradiso.2008.06.030
  • Kaabar W, Daar E, Gundogdu O, Jenneson PM, Farquharson MJ, Webb M, Jeynes C, Bradley DA. (2009) 'Metal deposition at the bone-cartilage interface in articular cartilage'. PERGAMON-ELSEVIER SCIENCE LTD APPLIED RADIATION AND ISOTOPES, 67 (3), pp. 475-479.
    doi: 10.1016/j.apradiso.2008.06.019
  • Perusko D, Milinovic V, Mitric M, Petrovic S, Jeynes C, Milosavljevic M. (2009) 'Ion Beam Modification of Al/Ti Multilayers'. TAYLOR & FRANCIS INC MATERIALS AND MANUFACTURING PROCESSES, 24 (10-11), pp. 1130-1133.
    doi: 10.1080/10426910903032246
  • Mordi CU, Eleruja MA, Taleatu BA, Egharevba GO, Adedeji AV, Akinwunmi OO, Olofinjana B, Jeynes C, Ajayi EOB. (2009) 'Metal Organic Chemical Vapour Deposited Thin Films of Cobalt Oxide Prepared via Cobalt Acetylacetonate'. JOURNAL MATER SCI TECHNOL JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 25 (1), pp. 85-89.
  • Molodtsov SL, Gurbich AF, Jeynes C. (2008) 'Accurate ion beam analysis in the presence of surface roughness'. IOP PUBLISHING LTD JOURNAL OF PHYSICS D-APPLIED PHYSICS, 41 (20) Article number ARTN 205303
    doi: 10.1088/0022-3727/41/20/205303
  • Slotte J, Rummukainen M, Tuomisto F, Markevich VP, Peaker AR, Jeynes C, Gwilliam RM. (2008) 'Evolution of vacancy-related defects upon annealing of ion-implanted germanium'. AMER PHYSICAL SOC PHYSICAL REVIEW B, 78 (8) Article number ARTN 085202
    doi: 10.1103/PhysRevB.78.085202
    Full text is available at: http://epubs.surrey.ac.uk/240/
  • Perusko D, Webb MJ, Milinovic V, Timotijevic B, Miosavljevic M, Jeynes C, Webb RP. (2008) 'On the ion irradiation stability of Al/Ti versus AlN/TiN multilayers'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Hyderabad, Sch Phys, Hyderabad, INDIA: 266 (8), pp. 1749-1753.
    doi: 10.1016/j.nimb.2008.02.034
  • Zhao Q, Liu Y, Wang C, Wang S, Peng N, Jeynes C. (2008) 'Reduction of bacterial adhesion on ion-implanted stainless steel surfaces'. ELSEVIER SCI LTD MEDICAL ENGINEERING & PHYSICS, 30 (3), pp. 341-349.
    doi: 10.1016/j.medengphy.2007.04.004
  • Barradas NP, Jeynes C. (2008) 'Advanced physics and algorithms in the IBA DataFurnace'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Hyderabad, Sch Phys, Hyderabad, INDIA: 266 (8), pp. 1875-1879.
    doi: 10.1016/j.nimb.2007.10.044
    Full text is available at: http://epubs.surrey.ac.uk/722448/
  • Beck L, Jeynes C, Barradas NP. (2008) 'Characterization of paint layers by simultaneous self-consistent fitting of RBS/PIXE spectra using simulated annealing'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Hyderabad, Sch Phys, Hyderabad, INDIA: 266 (8), pp. 1871-1874.
    doi: 10.1016/j.nimb.2007.12.091
  • Jeynes JCG, Jeynes C, Kirkby KJ, Ruemmeli A, Silva SRP. (2008) 'RBS/EBS/PIXE measurement of single-walled carbon nanotube modification by nitric acid purification treatment'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Hyderabad, Sch Phys, Hyderabad, INDIA: 266 (8), pp. 1569-1573.
    doi: 10.1016/j.nimb.2007.12.105
  • Gurbich AF, Jeynes C. (2007) 'Evaluation of non-Rutherford proton elastic scattering cross-section for magnesium'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 265 (2), pp. 447-452.
    doi: 10.1016/j.nimb.2007.07.025
  • Barradas NP, Arstila K, Battistig G, Bianconi M, Dytlewski N, Jeynes C, Kotai E, Lulli G, Mayer M, Rauhala E, Szilagyi E, Thompson M. (2007) 'International Atomic Energy Agency intercomparison of ion beam analysis software'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 262 (2), pp. 281-303.
    doi: 10.1016/j.nimb.2007.05.018
  • Zhao Q, Liu Y, Wang C, Wang S, Peng N, Jeynes C. (2007) 'Bacterial adhesion on ion-implanted stainless steel surfaces'. ELSEVIER SCIENCE BV APPLIED SURFACE SCIENCE, 253 (21), pp. 8674-8681.
    doi: 10.1016/j.apsusc.2007.04.044
  • Pascual-Izarra C, Barradas NP, Reis MA, Jeynes C, Menu M, Lavedrine B, Jacques Ezrati J, Roehrs S. (2007) 'Towards truly simultaneous PIXE and RBS analysis of layered objects in cultural heritage'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Ft Worth, TX: 261 (1-2), pp. 426-429.
    doi: 10.1016/j.nimb.2007.04.259
  • Eleruja MA, Egharevba GO, Abulude OA, Akinwunmi OO, Jeynes C, Ajayi EOB. (2007) 'Preparation and characterization of metalorganic chemical vapor deposited nickel oxide and lithium nickel oxide thin films'. SPRINGER JOURNAL OF MATERIALS SCIENCE, 42 (8), pp. 2758-2765.
    doi: 10.1007/s10853-006-1405-9
  • Clough AS, Collins SA, Gauntlett FE, Hodgson MR, Jeynes C, Rihawy MS, Todd AM, Thompson RL. (2006) 'In situ water permeation measurement using an external He-3(2+) ion beam'. ELSEVIER SCIENCE BV JOURNAL OF MEMBRANE SCIENCE, 285 (1-2), pp. 137-143.
    doi: 10.1016/j.memsci.2006.08.014
  • Admans LL, Jeynes C, Clarke J, Spyrou NM. (2006) 'Elemental content of erythrocytes from patients undergoing Coronary Artery Bypass Grafting (CABG) surgery using PIXE analysis'. SPRINGER JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY, 269 (3), pp. 619-623.
    doi: 10.1007/s10967-006-0274-7
  • Webb M, Jeynes C, Gwilliam R, Royle A, Sealy B. (2006) 'Characterising ion-cut in GaAs by Rutherford backscattering spectroscopy'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Seville, SPAIN: 249, pp. 429-431.
    doi: 10.1016/j.nimb.2006.04.045
  • Jeynes C, Peng N, Barradas NP, Gwilliam RM. (2006) 'Quality assurance in an implantation laboratory by high accuracy RBS'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Seville, SPAIN: 249, pp. 482-485.
    doi: 10.1016/j.nimb.2006.03.171
  • Lee WP, Gundabala VR, Akpa BS, Johns ML, Jeynes C, Routh AF. (2006) 'Distribution of surfactants in latex films: A Rutherford backscattering study'. AMER CHEMICAL SOC LANGMUIR, 22 (12), pp. 5314-5320.
    doi: 10.1021/la0601760
  • Barradas NP, Alves E, Jeynes C, Tosaki M. (2006) 'Accurate simulation of backscattering spectra in the presence of sharp resonances'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 247 (2), pp. 381-389.
    doi: 10.1016/j.nimb.2006.02.004
  • Rickerby J, Simon A, Jeynes C, Morgan TJ, Steinke JHG. (2006) '1,1,1,5,5,5-Hexafluoroacetylacetonate copper(I) poly(vinylsiloxane)s as precursors for copper direct-write'. AMER CHEMICAL SOC CHEMISTRY OF MATERIALS, 18 (10), pp. 2489-2498.
    doi: 10.1021/cm052103s
  • Analytis JG, Ardavan A, Blundell SJ, Owen RL, Garman EF, Jeynes C, Powell BJ. (2006) 'Effect of irradiation-induced disorder on the conductivity and critical temperature of the organic superconductor kappa-(BEDT-TTF)(2)Cu(SCN)(2)'. AMERICAN PHYSICAL SOC PHYSICAL REVIEW LETTERS, 96 (17) Article number ARTN 177002
    doi: 10.1103/PhysRevLett.96.177002
    Full text is available at: http://epubs.surrey.ac.uk/339/
  • Peaker AR, Markevich VP, Capan I, Dobaczewski L, Slotte J, Rummukainen M, Pivac B, Gwilliam R, Jeynes C. (2006) 'Understanding ion implantation defects in germanium'. ECS Transactions, 3 (2), pp. 67-76.
    doi: 10.1149/1.2356265
  • Sealy BJ, Smith AJ, Bennett N, Li L, Jeynes C, Emerson NG, Gwilliam RM, Cowern NEB, Alzanki T, Colombeau B, Collart EJH. (2006) 'Shallow junctions in silicon via low thermal budget processing'. Extended Abstracts of the Sixth International Workshop on Junction Technology, IWJT '06, , pp. 10-15.
  • Whelan S, Kelly MJ, Gwilliam R, Jeynes C, Bongiorno C. (2005) 'The dependence of the radiation damage formation on the substrate implant temperature in GaN during Mg ion implantation'. AMER INST PHYSICS JOURNAL OF APPLIED PHYSICS, 98 (1) Article number ARTN 013515
    doi: 10.1063/1.1940142
    Full text is available at: http://epubs.surrey.ac.uk/421/
  • Ilori OO, Osasona O, Eleruja MA, Egharevba GO, Adegboyega GA, Chiodelli G, Boudreault G, Jeynes C, Ajayi EOB. (2005) 'Preparation and characterization of metallorganic chemical vapour deposited molybdenum (II) oxide (MoO) thin films'. ELSEVIER SCIENCE SA THIN SOLID FILMS, 472 (1-2), pp. 84-89.
    doi: 10.1016/j.tsf.2004.06.135
  • Barradas NP, Added N, Arnoldbik WM, Bogdanovic-Radovic I, Bohne W, Cardoso S, Danner C, Dytlewski N, Freitas PP, Jaksic M, Jeynes C, Krug C, Lennard WN, Lindner S, Linsmeier C, Medunic Z, Pelicon P, Pezzi RP, Radtke C, Rohrich J, Sajavaara T, Salgado TDM, Stedile FC, Tabacniks MH, Vickridge I. (2005) 'A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 227 (3), pp. 397-419.
    doi: 10.1016/j.nimb.2004.08.021
  • Ilori OO, Osasona O, Eleruja MA, Egharevba GO, Adegboyega GA, Chiodelli G, Boudreault G, Jeynes C, Ajayi EOB. (2005) 'Preparation and characterization of metallorganic chemical vapour deposited LixMoyOz using a single source solid precursor'. INST IONICS IONICS, 11 (5-6), pp. 387-392.
    doi: 10.1007/BF02430252
  • Boudreault G, Elliman RG, Grotzschel R, Gujrathi SC, Jeynes C, Lennard WN, Rauhala E, Sajavaara T, Timmers H, Wang YQ, Weijers TDM. (2004) 'Round Robin: measurement of H implantation distributions in Si by elastic recoil detection'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 222 (3-4), pp. 547-566.
    doi: 10.1016/j.nimb.2004.02.022
  • Alzanki T, Gwilliam R, Emerson N, Tabatabaian Z, Jeynes C, Sealy BJ. (2004) 'Concentration profiles of antimony-doped shallow layers in silicon'. IOP PUBLISHING LTD SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 19 (6) Article number PII S0268-1242(04)71935-5 , pp. 728-732.
    doi: 10.1088/0268-1242/19/6/012
  • Simon A, Jeynes C, Webb RP, Finnis R, Tabatabian Z, Sellin PJ, Breese MBH, Fellows DF, van den Broek R, Gwilliam RM. (2004) 'The new Surrey ion beam analysis facility'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Albuquerque, NM: 219, pp. 405-409.
    doi: 10.1016/j.nimb.2004.01.091
  • Simpson TRE, Tabatabaian Z, Jeynes C, Parbhoo B, Keddie JL. (2004) 'Influence of interfaces on the rates of crosslinking in poly(dimethyl siloxane) coatings'. JOHN WILEY & SONS INC JOURNAL OF POLYMER SCIENCE PART A-POLYMER CHEMISTRY, 42 (6), pp. 1421-1431.
    doi: 10.1002/pola.20006
  • Boudreault G, Claudio G, Jeynes C, Low R, Sealy BJ. (2004) 'Accurate calibration of the retained fluence from a versatile single wafer implanter using RBS'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 217 (1), pp. 177-182.
    doi: 10.1016/j.nimb.2003.09.033
  • Aramendia E, Mallegol J, Jeynes C, Barandiaran MJ, Keddie JL, Asua JM. (2003) 'Distribution of surfactants near acrylic latex film surfaces: A comparison of conventional and reactive surfactants (surfmers)'. AMER CHEMICAL SOC LANGMUIR, 19 (8), pp. 3212-3221.
    doi: 10.1021/la0267950
  • Jeynes C, Barradas NP, Marriott PK, Boudreault G, Jenkin M, Wendler E, Webb RP. (2003) 'Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool'. IOP PUBLISHING LTD JOURNAL OF PHYSICS D-APPLIED PHYSICS, 36 (7) Article number PII S0022-3727(03)34952-6 , pp. R97-R126.
    doi: 10.1088/0022-3727/36/7/201
    Full text is available at: http://epubs.surrey.ac.uk/732756/
  • Peng N, Shao G, Jeynes C, Webb RP, Gwilliam RM, Boudreault G, Astill DM, Liang WY. (2003) 'Ion beam synthesis of superconducting MgB2 thin films'. AMER INST PHYSICS APPLIED PHYSICS LETTERS, 82 (2), pp. 236-238.
    doi: 10.1063/1.1537870
    Full text is available at: http://epubs.surrey.ac.uk/24/
  • Rozenberg GG, Bresler E, Speakman SP, Jeynes C, Steinke JHG. (2002) 'Patterned low temperature copper-rich deposits using inkjet printing'. AMER INST PHYSICS APPLIED PHYSICS LETTERS, 81 (27), pp. 5249-5251.
    doi: 10.1063/1.1481985
  • Kang DJ, Peng NH, Webb R, Jeynes C, Yun JH, Moon SH, Oh B, Burnell G, Tarte EJ, Moore DF, Blamire MG. (2002) 'Realization and properties of MgB2 metal-masked ion damage junctions'. AMER INST PHYSICS APPLIED PHYSICS LETTERS, 81 (19), pp. 3600-3602.
    doi: 10.1063/1.1519965
  • Too P, Ahmed S, Jeynes C, Sealy BJ, Gwilliam R. (2002) 'Electrical isolation of n-type InP using MeV iron implantation at different doses and substrate temperatures'. IEE-INST ELEC ENG ELECTRONICS LETTERS, 38 (20), pp. 1225-1226.
    doi: 10.1049/el:20020803
  • Eleruja MA, Adedeji AV, Egharevba GO, Lambi JN, Akanni MS, Jeynes C, Ajayi EOB. (2002) 'Preparation and characterization of undoped zinc oxide and uranium doped zinc oxide thin films'. ELSEVIER SCIENCE BV OPTICAL MATERIALS, 20 (2) Article number PII S0925-3467(02)00057-5 , pp. 119-123.
    doi: 10.1016/S0925-3467(02)00057-5
  • Barradas NP, Jeynes C, Webb RP, Wendler E. (2002) 'Accurate determination of the stopping power of He-4 in Si using Bayesian inference'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 194 (1) Article number PII S0168-583X(02)00494-9 , pp. 15-25.
    doi: 10.1016/S0168-583X(02)00494-9
  • Boudreault G, Jeynes C, Wendler E, Nejim A, Webb RP, Watjen U. (2002) 'Accurate RBS measurement of ion implant doses in a silicon'. JOHN WILEY & SONS LTD SURFACE AND INTERFACE ANALYSIS, 33 (6), pp. 478-486.
    doi: 10.1002/sia.1235
  • Mallegol J, Gorce JP, Dupont O, Jeynes C, McDonald PJ, Keddie JL. (2002) 'Origins and effects of a surfactant excess near the surface of waterborne acrylic pressure-sensitive adhesives'. AMER CHEMICAL SOC LANGMUIR, 18 (11), pp. 4478-4487.
    doi: 10.1021/la0117698
  • Gurbich AF, Barradas NP, Jeynes C, Wendler E. (2002) 'Applying elastic backscattering spectrometry when the nuclear excitation function has a fine structure'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, CAIRNS, AUSTRALIA: 190 Article number PII S0168-583X(01)01211-3 , pp. 237-240.
    doi: 10.1016/S0168-583X(01)01211-3
  • Jeynes C, Rozenberg GG, Speakman SP, Steinke JHG. (2002) 'A microbeam RBS analysis of low temperature direct-write inkjet deposited copper'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, UNIV SURREY, GUILDFORD, ENGLAND: 188 Article number PII S0168-583X(01)01063-1 , pp. 141-145.
    doi: 10.1016/S0168-583X(01)01063-1
  • Kang DJ, Burnell G, Lloyd SJ, Speaks RS, Peng NH, Jeynes C, Webb R, Yun JH, Moon SH, Oh B, Tarte EJ, Moore DF, Blamire MG. (2002) 'Realization and properties of YBa2Cu3O7-delta Josephson junctions by metal masked ion damage technique'. AMER INST PHYSICS APPLIED PHYSICS LETTERS, 80 (5), pp. 814-816.
    doi: 10.1063/1.1446998
  • Adedeji AV, Egharevba GO, Jeynes C, Ajayi EOB. (2002) 'Preparation and characterization of pyrolytically deposited (Co-V-O and Cr-V-O) thin films'. ELSEVIER SCIENCE SA THIN SOLID FILMS, 402 (1-2), pp. 49-54.
    doi: 10.1016/S0040-6090(01)01602-9
  • Milosavljevic M, Shao G, Bibic N, McKinty CN, Jeynes C, Homewood KP. (2001) 'Amorphous-iron disilicide: A promising semiconductor'. AMER INST PHYSICS APPLIED PHYSICS LETTERS, 79 (10), pp. 1438-1440.
  • Surkova T, Patane A, Eaves L, Main PC, Henini M, Polimeni A, Knights AP, Jeynes C. (2001) 'Indium interdiffusion in annealed and implanted InAs/(AlGa)As self-assembled quantum dots'. AMER INST PHYSICS JOURNAL OF APPLIED PHYSICS, 89 (11), pp. 6044-6047.
    doi: 10.1063/1.1369397
  • Ross GJ, Barradas NP, Hill MP, Jeynes C, Morrissey P, Watts JF. (2001) 'Rutherford backscattering spectrometry and computer simulation for the in-depth analysis of chemically modified poly(vinylidene fluoride)'. KLUWER ACADEMIC PUBL JOURNAL OF MATERIALS SCIENCE, 36 (19), pp. 4731-4738.
    doi: 10.1023/A:1017979005467
  • Vieira A, Barradas NP, Jeynes C. (2001) 'Error performance analysis of artificial neural networks applied to Rutherford backscattering'. JOHN WILEY & SONS LTD SURFACE AND INTERFACE ANALYSIS, 31 (1), pp. 35-38.
    doi: 10.1002/sia.949
  • Jeynes C, Barradas NP, Rafla-Yuan H, Hichwa BP, Close R. (2000) 'Accurate depth profiling of complex optical coatings'. WILEY-BLACKWELL SURFACE AND INTERFACE ANALYSIS, SEVILLE, SPAIN: 30 (1), pp. 237-242.
    doi: 10.1002/1096-9918(200008)30:1<237::AID-SIA751>3.0.CO;2-G
  • Kahlmann F, Booij WE, Blamire MG, McBrien PF, Tarte EJ, Peng NH, Jeynes C, Romans EJ, Pegrum CM. (2000) 'Transfer function and noise properties of YBa2Cu3O7-delta direct-current superconducting-quantum-interference-device magnetometers with resistively shunted inductances'. AMER INST PHYSICS APPLIED PHYSICS LETTERS, 77 (4), pp. 567-569.
    doi: 10.1063/1.127046
  • Emerson NG, Gwilliam RM, Shannon JM, Jeynes C, Sealy BJ, Tsvetkova T, Tzenov N, Tzolov M, Dimova-Malinovska D. (2000) 'Electrical and optical properties of Co+ ion implanted a-Si1-xCx : H alloys'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 160 (4), pp. 505-509.
    doi: 10.1016/S0168-583X(99)00630-8
  • Jeynes C, Barradas NP, Wilde JR, Greer AL. (2000) 'Composition of Ni-Ta-C thick films using simulated annealing analysis of elastic backscattering spectrometry data'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, DRESEDEN, GERMANY: 161, pp. 287-292.
    doi: 10.1016/S0168-583X(99)00950-7
  • Milosavljevic M, Bibic N, Perusko D, Jeynes C, Bangert U. (2000) 'The effects of implanted arsenic on Ti-silicide formation'. TRANS TECH-SCITEC PUBLICATIONS LTD SOLID STATE PHENOMENA, 71, pp. 147-171.
  • Tzitzinou A, Keddie JL, Jeynes C, Mulder M, Geurts J, Treacher KE, Satguru R, Zhdan P. (1999) 'Molecular weight effects on film formation of latex and surfactant morphology.'. AMER CHEMICAL SOC ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 218, pp. U609-U609.
  • Barradas NP, Jeynes C, Jenkin M, Marriott PK. (1999) 'Bayesian error analysis of Rutherford backscattering spectra'. ELSEVIER SCIENCE SA THIN SOLID FILMS, BIRMINGHAM, ENGLAND: 343, pp. 31-34.
    doi: 10.1016/S0040-6090(98)01681-2
  • Toal SJ, Reehal HS, Webb SJ, Barradas NP, Jeynes C. (1999) 'Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD'. ELSEVIER SCIENCE SA THIN SOLID FILMS, BIRMINGHAM, ENGLAND: 343, pp. 292-294.
    doi: 10.1016/S0040-6090(98)01585-5
  • Barradas NP, Knights AP, Jeynes C, Mironov OA, Grasby TJ, Parker EHC. (1999) 'High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms'. AMERICAN PHYSICAL SOC PHYSICAL REVIEW B, 59 (7), pp. 5097-5105.
    doi: 10.1103/PhysRevB.59.5097
  • Simonsen AC, Pohler JP, Jeynes C, Tougaard S. (1999) 'Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES'. JOHN WILEY & SONS LTD SURFACE AND INTERFACE ANALYSIS, 27 (1), pp. 52-56.
  • Barradas NP, Jeynes C, Webb RP, Kreissig U, Grotzschel R. (1999) 'Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 149 (1-2), pp. 233-237.
    doi: 10.1016/S0168-583X(98)00731-9
  • Barradas NP, Almeida SA, Jeynes C, Knights AP, Silva SRP, Sealy BJ. (1999) 'RES and ERDA study of ion beam synthesised amorphous gallium nitride'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ROYAL TROP INST, AMSTERDAM, NETHERLANDS: 148 (1-4), pp. 463-467.
    doi: 10.1016/S0168-583X(98)00702-2
  • Kozanecki A, Stepikhova M, Lanzerstorfer S, Jantsch W, Palmetshofer L, Sealy BJ, Jeynes C. (1998) 'Excitation of Er3+ ions in silicon dioxide films thermally grown on silicon'. AMER INST PHYSICS APPLIED PHYSICS LETTERS, 73 (20), pp. 2929-2931.
    doi: 10.1063/1.122633
  • Jenneson PM, Clough AS, Hollands R, Mulheron MJ, Jeynes C. (1998) 'Profiling chlorine diffusion into ordinary Portland cement and pulverized fuel ash pastes using scanning MeV proton micro-PIXE'. SPRINGER JOURNAL OF MATERIALS SCIENCE LETTERS, 17 (14), pp. 1173-1175.
    doi: 10.1023/A:1006508820103
  • Barradas NP, Jeynes C, Homewood KP, Sealy BJ, Milosavljevic M. (1998) 'RBS/simulated annealing analysis of silicide formation in Fe/Si systems'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, EINDHOVEN UNIV, EINDHOVEN, NETHERLANDS: 139 (1-4), pp. 235-238.
    doi: 10.1016/S0168-583X(97)00964-6
  • Nejim A, Knights AP, Jeynes C, Coleman PG, Patel CJ. (1998) 'Profile broadening of high dose germanium implants into (100) silicon at elevated temperatures due to channeling'. AMER INST PHYSICS JOURNAL OF APPLIED PHYSICS, 83 (7), pp. 3565-3573.
    doi: 10.1063/1.366573
  • Barradas NP, Jeynes C, Mironov OA, Phillips PJ, Parker EHC. (1998) 'High depth resolution Rutherford backscattering analysis of Si-Si0.78Ge0.22/(0 0 1)Si superlattices'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, EINDHOVEN UNIV, EINDHOVEN, NETHERLANDS: 139 (1-4), pp. 239-243.
    doi: 10.1016/S0168-583X(97)00965-8
  • Barradas NP, Jeynes C, Harry MA. (1998) 'RBS/simulated annealing analysis of iron-cobalt silicides'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, LISBON, PORTUGAL: 136, pp. 1163-1167.
    doi: 10.1016/S0168-583X(97)00809-4
  • Barradas NP, Jeynes C, Jackson SM. (1998) 'RBS/simulated annealing analysis of buried SiCOx layers formed by implantation of O into cubic silicon carbide'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, LISBON, PORTUGAL: 136, pp. 1168-1171.
    doi: 10.1016/S0168-583X(97)00686-1
  • Barradas NP, Jeynes C, Webb RP. (1997) 'Simulated annealing analysis of Rutherford backscattering data'. AMER INST PHYSICS APPLIED PHYSICS LETTERS, 71 (2), pp. 291-293.
    doi: 10.1063/1.119524
  • Jeynes C, Jafri ZH, Webb RP, Kimber AC, Ashwin MJ. (1997) 'Accurate RBS measurements of the indium content of InGaAs thin films'. JOHN WILEY & SONS LTD SURFACE AND INTERFACE ANALYSIS, 25 (4), pp. 254-260.
    doi: 10.1002/(SICI)1096-9918(199704)25:4<254::AID-SIA232>3.3.CO;2-6
  • Osasona O, Djebah A, Ojo IAO, Eleruja MA, Adedeji AV, Jeynes C, Ajayi EOB. (1997) 'Preparation and characterization of MOCVD thin films of zinc sulphide'. ELSEVIER SCIENCE BV OPTICAL MATERIALS, 7 (3), pp. 109-115.
    doi: 10.1016/S0925-3467(96)00065-1
  • Ashwin MJ, Pritchard RE, Newman RC, Joyce TB, Bullough TJ, Wagner J, Jeynes C, Breuer SJ, Jones R, Briddon PR, Oberg S. (1996) 'The bonding of C-As acceptors in InxGa1-xAs grown by chemical beam epitaxy using carbon tetrabromide as the source of carbon'. AMER INST PHYSICS JOURNAL OF APPLIED PHYSICS, 80 (12), pp. 6754-6760.
    doi: 10.1063/1.363803
  • Li YP, Kilner JA, Thomas J, Lacey D, Cohen LF, Caplin AD, Li YH, Saba FM, Quincey PG, Somekh RE, Jeynes C, Jafri ZH. (1996) 'Characterization of YBa2Cu3O7-delta thin films deposited by dc magnetron sputtering'. CHAPMAN HALL LTD JOURNAL OF MATERIALS SCIENCE, 31 (23), pp. 6137-6144.
    doi: 10.1007/BF00354430
  • Jeynes C, Puttick KE, Whitmore LC, Gartner K, Gee AE, Millen DK, Webb RP, Peel RMA, Sealy BJ. (1996) 'Laterally resolved crystalline damage in single-point-diamond-turned silicon'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ARIZONA STATE UNIV CAMPUS, TEMPE, AZ: 118 (1-4), pp. 431-436.
    doi: 10.1016/0168-583X(95)01464-0
  • Yousif KM, Smith BE, Jeynes C. (1996) 'Investigation of microstructure of molybdenum-copper black electrodeposited coatings with reference to solar selectivity'. CHAPMAN HALL LTD JOURNAL OF MATERIALS SCIENCE, 31 (1), pp. 185-191.
    doi: 10.1007/BF00355143
  • MUTTI P, SKLAR Z, BRIGGS GAD, JEYNES C. (1995) 'ELASTIC PROPERTIES OF GAAS DURING AMORPHIZATION BY ION-IMPLANTATION'. AMER INST PHYSICS JOURNAL OF APPLIED PHYSICS, 77 (6), pp. 2388-2392.
    doi: 10.1063/1.358763
  • KAZOR A, JEYNES C, BOYD IW. (1994) 'FLUORINE ENHANCED OXIDATION OF SILICON AT LOW-TEMPERATURES'. AMER INST PHYSICS APPLIED PHYSICS LETTERS, 65 (12), pp. 1572-1574.
    doi: 10.1063/1.112918
  • CURRENT MI, OHNO N, HURLEY K, KEENAN WA, GUITNER TL, JEYNES C. (1993) 'MICROUNIFORMITY MEASUREMENTS OF ION-IMPLANTED SILICON'. PENNWELL PUBL CO SOLID STATE TECHNOLOGY OFFICE SOLID STATE TECHNOLOGY, 36 (7), pp. 111-&.
  • DUNSTAN DJ, DIXON RH, KIDD P, HOWARD LK, WILKINSON VA, LAMBKIN JD, JEYNES C, HALSALL MP, LANCEFIELD D, EMENY MT, GOODHEW PJ, HOMEWOOD KP, SEALY BJ, ADAMS AR. (1993) 'GROWTH AND CHARACTERIZATION OF RELAXED EPILAYERS OF INGAAS ON GAAS'. ELSEVIER SCIENCE BV JOURNAL OF CRYSTAL GROWTH, 126 (4), pp. 589-600.
    doi: 10.1016/0022-0248(93)90808-A
  • SHOJAI A, REED GT, JEYNES C. (1992) 'DIFFUSION OF ION-IMPLANTED NEODYMIUM IN SILICA'. IOP PUBLISHING LTD JOURNAL OF PHYSICS D-APPLIED PHYSICS, 25 (8), pp. 1280-1283.
    doi: 10.1088/0022-3727/25/8/021
  • STRICKLAND KR, EDWARDS SC, WIGMORE JK, COLLINS RA, JEYNES C. (1992) 'STUDY OF ION-IMPLANTATION AND ANNEALING EFFECTS IN SILICON-WAFERS USING HIGH-FREQUENCY PHONON-SCATTERING'. JOHN WILEY & SONS LTD SURFACE AND INTERFACE ANALYSIS, 18 (8), pp. 631-636.
    doi: 10.1002/sia.740180810
  • SPYROU NM, ARSHED W, FAROOQI AS, IBEANU GI, AKANLE OA, JEYNES C, ASUBIOJO OI, OBIOH IB, OLUYEMI EA, OLUWOLE AF. (1992) 'USEFULNESS OF NUCLEAR AND ATOMIC-BASED ANALYSIS TECHNIQUES IN AIR-POLLUTION STUDIES IN NIGERIA'. AKADEMIAI KIADO JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES, 161 (1), pp. 189-199.
    doi: 10.1007/BF02034892
  • FAROOQI AS, ARSHED W, AKANLE OA, JEYNES C, SPYROU NM. (1992) 'FLUORINE DETERMINATION IN DIET SAMPLES USING CYCLIC INAA AND PIGE ANALYSIS'. AKADEMIAI KIADO JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES, 161 (1), pp. 71-78.
    doi: 10.1007/BF02034881
  • TANG YS, WILKINSON CDW, JEYNES C. (1992) 'PD/TI BILAYER CONTACTS TO HEAVILY DOPED POLYCRYSTALLINE SILICON'. AMER INST PHYSICS JOURNAL OF APPLIED PHYSICS, 72 (1), pp. 311-312.
    doi: 10.1063/1.352140
  • MAHMOOD F, AHMED H, JEYNES C, GILLIN WP. (1992) 'REACTIVE FORMATION OF COBALT SILICIDE ON SINGLE-CRYSTAL SILICON UNDER RAPID ELECTRON-BEAM HEATING'. ELSEVIER SCIENCE BV APPLIED SURFACE SCIENCE, 59 (1), pp. 55-62.
    doi: 10.1016/0169-4332(92)90168-W
  • PUTTICK KE, JEYNES C, RUDMAN M, GEE AE, CHAO CL. (1992) 'SURFACE DAMAGE IN NANOMACHINED SILICON'. IOP PUBLISHING LTD SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 7 (2), pp. 255-259.
    doi: 10.1088/0268-1242/7/2/013
  • MATTHEWS AP, JEYNES C, REESON KJ, THORNTON J, SPYROU NM. (1992) 'QUANTIFICATION OF THE SEPARATE MATRIX CONSTITUENTS OF SPHEROIDAL GRAPHITE CAST-IRON IMPLANTED WITH N-15 BY NUCLEAR-REACTION ANALYSIS USING AN ION MICROPROBE'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, EINDHOVEN UNIV TECHNOL, EINDHOVEN, NETHERLANDS: 64 (1-4), pp. 452-456.
    doi: 10.1016/0168-583X(92)95514-R
  • KOZANECKI A, CHAN M, JEYNES C, SEALY B, HOMEWOOD K. (1991) 'LATTICE LOCATION OF ERBIUM IMPLANTED INTO GAAS'. PERGAMON-ELSEVIER SCIENCE LTD SOLID STATE COMMUNICATIONS, 78 (8), pp. 763-766.
    doi: 10.1016/0038-1098(91)90860-X
  • BALIGA CB, TSAKIROPOULOS P, JEYNES C. (1991) 'SURFACE CONTAMINATION AND ITS EFFECT ON THE CORROSION OF RAPIDLY SOLIDIFIED MG-AL ALLOY SPLATS'. CHAPMAN HALL LTD JOURNAL OF MATERIALS SCIENCE, 26 (6), pp. 1497-1504.
    doi: 10.1007/BF00544658
  • DEVEIRMAN A, VANLANDUYT J, REESON KJ, GWILLIAM R, JEYNES C, SEALY BJ. (1990) 'IDENTIFICATION OF COSI INCLUSIONS WITHIN BURIED COSI2 LAYERS FORMED BY ION-IMPLANTATION'. AMER INST PHYSICS JOURNAL OF APPLIED PHYSICS, 68 (7), pp. 3792-3794.
    doi: 10.1063/1.346308
  • SPYROU NM, ALTAF WJ, GILL BS, JEYNES C, NICOLAOU G, PIETRA R, SABBIONI E, SURIAN M. (1990) 'FLUORINE CONCENTRATIONS IN BONE-BIOPSY SAMPLES DETERMINED BY PROTON-INDUCED GAMMA-RAY EMISSION AND CYCLIC NEUTRON-ACTIVATION'. HUMANA PRESS INC BIOLOGICAL TRACE ELEMENT RESEARCH, 26-7, pp. 161-168.
    doi: 10.1007/BF02992669
  • ALTRIP JL, EVANS AGR, LOGAN J, JEYNES C. (1990) 'HIGH-TEMPERATURE MILLISECOND ANNEALING OF ARSENIC IMPLANTED SILICON'. PERGAMON-ELSEVIER SCIENCE LTD SOLID-STATE ELECTRONICS, 33 (6), pp. 659-664.
    doi: 10.1016/0038-1101(90)90179-I
  • CREAN GM, COLE PD, JEYNES C. (1990) 'RANGE DISTRIBUTIONS OF ION-IMPLANTED BORON, PHOSPHORUS AND ARSENIC DOPANTS IN THERMALLY REACTED TITANIUM SILICIDE THIN-FILMS'. PERGAMON-ELSEVIER SCIENCE LTD SOLID-STATE ELECTRONICS, 33 (6), pp. 655-658.
    doi: 10.1016/0038-1101(90)90178-H
  • JAFRI ZH, JEYNES C, WEBB RP, WILSON IH. (1990) 'MASS-TRANSPORT OF SILICON DURING ARGON IRRADIATION EMPLOYING A DOUBLE-MARKER SYSTEM'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, AARHUS, DENMARK: 48 (1-4), pp. 457-460.
    doi: 10.1016/0168-583X(90)90160-V
  • BRUNSON KM, SANDS D, THOMAS CB, JEYNES C, WATTS JF. (1990) 'COMPOSITION AND STRUCTURE OF SEMI-INSULATING POLYCRYSTALLINE SILICON THIN-FILMS'. TAYLOR & FRANCIS LTD PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 61 (3), pp. 361-376.
    doi: 10.1080/13642819008208640
  • AJAYI OB, AKANNI MS, LAMBI JN, JEYNES C, WATTS JF. (1990) 'COMPOSITIONAL STUDIES OF VARIOUS METAL-OXIDE COATINGS ON GLASS'. ELSEVIER SCIENCE SA LAUSANNE THIN SOLID FILMS, 185 (1), pp. 123-136.
    doi: 10.1016/0040-6090(90)90012-3
  • REESON K, DEVEIRMAN A, GWILLIAM R, JEYNES C, SEALY B, VANLANDUYT J. (1989) 'TEM AND RBS STUDIES OF EPITAXIAL COSI2 LAYERS FORMED BY HIGH-DOSE COBALT IMPLANTATION INTO SILICON'. IOP PUBLISHING LTD INST PHYS CONF SER, (100), pp. 627-634.
  • REESON KJ, DEVEIRMAN A, GWILLIAM R, JEYNES C, SEALY BJ, VANLANDUYT J. (1989) 'TEM AND RBS STUDIES OF EPITAXIAL COSI2 LAYERS FORMED BY HIGH-DOSE COBALT IMPLANTATION INTO SILICON'. IOP PUBLISHING LTD INSTITUTE OF PHYSICS CONFERENCE SERIES, (100), pp. 627-634.
  • JAFRI ZH, JEYNES C, WEBB RP, WILSON IH. (1989) 'OBSERVATION OF SWELLING AND SPUTTERING OF A SILICON TARGET UNDER ARGON ION IRRADIATION USING A DOUBLE MARKER TECHNIQUE'. PERGAMON-ELSEVIER SCIENCE LTD VACUUM, UNIV SURREY, GUILDFORD, ENGLAND: 39 (11-12), pp. 1119-1121.
    doi: 10.1016/0042-207X(89)91103-2

Conference papers

  • Peng N, Jeynes C, Gwilliam RM, Webb RP, Pan F, Chen X. (2012) 'On fabrication of high concentration Mn doped Si by ion implantation: problem and challenge'. ELSEVIER SCIENCE BV 18TH INTERNATIONAL VACUUM CONGRESS (IVC-18), Beijing, PEOPLES R CHINA: 18th International Vacuum Congress (IVC)/International Conference on Nanoscience and Technology (ICNT)/14th International Conference on Surfaces Science (ICSS)/Vacuum and Surface Sciences Conference of Asia and Australia (VASSCAA) 32, pp. 408-411.
    doi: 10.1016/j.phpro.2012.03.577
  • Razali MA, Smith AJ, Jeynes C, Gwilliam RM, Pelaz L, Santos I, Duffy R, Torregrosa F, Bourdelle K. (2012) 'Temperature-Dependant Study Of Phosphorus Ion Implantation In Germanium'. AMER INST PHYSICS ION IMPLANTATION TECHNOLOGY 2012, Valladolid, SPAIN: 19th International Conference on Ion Implantation Technology (IIT) 1496, pp. 193-196.
    doi: 10.1063/1.4766522
  • Bradley DA, Kaabar W, Gundogdu O, Farquharson MJ, Janousch M, Bailey M, Jeynes C. (2010) 'Synchrotron and ion beam studies of the bone-cartilage interface'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, Melbourne, AUSTRALIA: 11th International Symposium on Radiation Physics 619 (1-3), pp. 330-337.
    doi: 10.1016/j.nima.2009.10.142
  • Antwis L, Wong L, Smith A, Homewood K, Jeynes C, Gwilliam R. (2010) 'Optimization and characterisation of amorphous iron disilicide formed by ion beam mixing of Fe/Si multilayer structures for photovoltaic applications'. AIP Conference Proceedings, 1321, pp. 278-281.
    doi: 10.1063/1.3548379
  • Bailey MJ, Jeynes C, Sealy BJ, Webb RP, Gwilliam RM. (2010) 'On artefacts in the secondary ion mass spectrometry profiling of high fluence H+ implants in GaAs'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Cambridge, Cambridge, ENGLAND: 19th International Conference on Ion Beam Analysis 268 (11-12), pp. 2051-2055.
    doi: 10.1016/j.nimb.2010.02.033
  • Jeynes JCG, Bailey MJ, Coley H, Kirkby KJ, Jeynes C. (2010) 'Microbeam PIXE analysis of platinum resistant and sensitive ovarian cancer cells'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Cambridge, Cambridge, ENGLAND: 19th International Conference on Ion Beam Analysis 268 (11-12), pp. 2168-2171.
    doi: 10.1016/j.nimb.2010.02.042
  • Webb R, Bailey M, Jeynes C, Grime G. (2010) '19th International Conference on Ion Beam Analysis'. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 268 (11-12)
    doi: 10.1016/j.nimb.2010.04.016
  • Milosavljević M, Peruško D, Milinović V, Timotijević B, Zalar A, Kovač J, Jeynes C. (2009) 'High ion irradiation tolerance of multilayered AlN/TiN nanocomposites'. International Atomic Energy Agency (IAEA) Proceedings of International Topical Meeting on Nuclear Research Applications and Utilization of Accelerators, Vienna, Austria: International Topical Meeting on Nuclear Research Applications and Utilization of Accelerators
  • Bailey MJ, Kirkby KJ, Jeynes C. (2009) 'Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study'. JOHN WILEY & SONS LTD X-RAY SPECTROMETRY, Cavtat, CROATIA: 13th European X-Ray Spectrometry Conference (EXRS 2008) 38 (3), pp. 190-194.
    doi: 10.1002/xrs.1142
  • Peng N, Jeynes C, Bailey MJ, Adikaari D, Stolojan V, Webb RP. (2009) 'High concentration Mn ion implantation in Si'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Dresden, GERMANY: 16th International Conference on Ion Beam Modification of Materials 267 (8-9), pp. 1623-1625.
    doi: 10.1016/j.nimb.2009.01.065
  • Stennett MC, Hyatt NC, Reid DP, Maddrell ER, Peng N, Jeynes C, Kirkby KJ, Woicik JC, Ravel B. (2009) 'Heavy ion implantation combined with grazing incidence X-ray absorption spectroscopy (GIXAS): A new methodology for the characterisation of radiation damage in nuclear ceramics'. MRS Proceedings, San Francisco, USA: MRS Spring Meeting 2009: Scientific Basis for Nuclear Waste Management XXXIII 1193, pp. 67-72.
    doi: 10.1557/PROC-1193-67
  • Stennett MC, Hyatt NC, Reid DP, Maddrell ER, Peng N, Jeynes C, Kirkby KJ, Woicik JC, Hyatt NC, Pickett DA, Rebak RB. (2009) 'Characterisation of Ion Beam Irradiated Zirconolite for Pu Disposition'. MATERIALS RESEARCH SOCIETY SCIENTIFIC BASIS FOR NUCLEAR WASTE MANAGEMENT XXXII, Boston, MA: 32nd Symposium on Scientific Basis for Nuclear Waste Management held at the 2008 MRS Fall Meeting 1124, pp. 243-248.
  • Jeynes C, Bailey MJ, Peng N, Zoppi G, Forbes I. (2009) 'Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis'. 1st International Conference on Sustainable Power Generation and Supply, SUPERGEN '09,
    doi: 10.1109/SUPERGEN.2009.5348162
    Full text is available at: http://epubs.surrey.ac.uk/715434/

    Abstract

    There are many technical challenges in the fabrication of devices from novel materials. The characterization of these materials is critical in the development of efficient photovoltaic systems. We show how the application of recent advances in MeV IBA, providing the self-consistent treatment of RBS (Rutherford backscattering) and PIXE (particle induced X-ray emission) spectra, makes a new set of powerful complementary depth profiling techniques available for all thin film technologies, including the chalcopyrite compound semiconductors. We will give and discuss a detailed analysis of a CuInAl metallic precursor film, showing how similar methods are also applicable to other films of interest.

  • Perusko D, Milosavljevic M, Milinovic V, Timotijevic B, Zalar A, Kovac J, Pracek B, Jeynes C. (2008) 'High fluence nitrogen implantation in Al/Ti multilayers'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Florence, ITALY: 9th European Conference on Accelerators in Applied Research and Technology 266 (10), pp. 2503-2506.
    doi: 10.1016/j.nimb.2008.03.034
  • Barradas NP, Arstila K, Battistig G, Bianconi M, Dytlewski N, Jeynes C, Kotai E, Lulli G, Mayer M, Rauhala E, Szilagyi E, Thompson M. (2008) 'Summary of "IAEA intercomparison of IBA software"'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Hyderabad, Sch Phys, Hyderabad, INDIA: 18th International Conference on Ion Beam Analysis 266 (8), pp. 1338-1342.
    doi: 10.1016/j.nimb.2007.10.043
    Full text is available at: http://epubs.surrey.ac.uk/722449/
  • Gurbich A, Bogdanovic-Radovic I, Chiari M, Jeynes C, Kokkoris M, Ramos AR, Mayer M, Rauhala E, Schwerer O, Liqun S, Vickridge I. (2008) 'Status of the problem of nuclear cross section data for IBA'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Hyderabad, Sch Phys, Hyderabad, INDIA: 18th International Conference on Ion Beam Analysis 266 (8), pp. 1198-1202.
    doi: 10.1016/j.nimb.2007.11.041
  • Lazzeri P, Oehrlein GS, Stueber GJ, McGowan R, Busch E, Pederzoli S, Jeynes C, Bersani M, Anderle M. (2008) 'Interactions of photoresist stripping plasmas with nanoporous organo-silicate ultra low dielectric constant dielectrics'. ELSEVIER SCIENCE SA THIN SOLID FILMS, Nagoya, JAPAN: 28th Dry Process Symposium (DPS) 516 (11), pp. 3697-3703.
    doi: 10.1016/j.tsf.2007.08.043
  • Peng N, Jeynes C, Gwilliam RM, Kirkby KJ, Webb RP. (2007) 'Depth profile analysis for MgB2 thin films, formed by B implantation in Mg ribbons using energetic ion backscatterings'. ELSEVIER SCIENCE BV PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, Dresden, GERMANY: 8th International Conference on Materials and Mechanisms of Superconductivity and High Temperature Superconductors 460, pp. 600-601.
    doi: 10.1016/j.physc.2007.04.120
  • Mistry P, Gomez-Morilla I, Smith RC, Thomson D, Grime GW, Webb RP, Gwilliam R, Jeynes C, Cansell A, Merchant M, Kirkby KJ. (2007) 'Maskless proton beam writing in gallium arsenide'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Singapore, SINGAPORE: 10th International Conference on Nuclear Microprobe Technology and Applications held in Conjunction with the 2nd International Workshop on Proton Beam Writing 260 (1), pp. 437-441.
    doi: 10.1016/j.nimb.2007.02.059
  • Simon A, Csako T, Jeynes C, Szorenyi T. (2006) 'High lateral resolution 2D mapping of the B/C ratio in a boron carbide film formed by ferntosecond pulsed laser deposition'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Seville, SPAIN: 17th International Conference on Ion Beam Analysis 249, pp. 454-457.
    doi: 10.1016/j.nimb.2006.03.030
  • Yakovlev EV, Talalaev RA, Martin RW, Jeynes C, Peng N, Deatcher CJ, Watson IM, Hildebrandt S, Stutzmann M. (2006) 'Modeling and experimental analysis of InGaN MOVPE in the Aixtron AIX 200/4 RF-S horizontal reactor'. WILEY-VCH, INC Physica Status Solidi C - Current Topics in Solid State Physics, Vol 3, No 6, Bremen, GERMANY: 6th International Conference on Nitride Semiconductors (ICNS-6) 3 (6), pp. 1620-1623.
    doi: 10.1002/pssc.200565182
  • Mistry P, Gomez-Morilla I, Grime GW, Webb R, Jeynes C, Gwilliarn R, Cansell A, Merchant M, Kirkby KJ. (2006) 'Proton beam lithography at the University of Surrey's Ion Beam Centre'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Pacific Grove, CA: 14th International Conference on Ion Beam Modification of Materials (IBMM 2004) 242 (1-2), pp. 387-389.
    doi: 10.1016/j.nimb.2005.08.128
  • Sharp JA, Gwilliam RM, Sealy BJ, Jeynes C, Hamilton JJ, Kirkby KJ. (2005) 'Evaluation of BBr2+ and B++Br+ implants in silicon'. ELSEVIER SCIENCE SA MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, Strasbourg, FRANCE: Symposium on Materials Science and Device Issues for Futrue Si-Based Technologies held at the 2005 EMRS Meeting 124, pp. 196-199.
    doi: 10.1016/j.mseb.2005.08.065
  • Webb M, Jeynes C, Gwilliam R, Too P, Kozanecki A, Domagala J, Royle A, Sealy B. (2005) 'The influence of the ion implantation temperature and the dose rate on smart-cut (c) in GaAs'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Natl Museum Folk Arts & Tradit, Paris, FRANCE: 8th European Conference on Accelerators in Applied Research and Technology 240 (1-2), pp. 142-145.
    doi: 10.1016/j.nimb.2005.06.104
  • Webb M, Jeynes C, Gwilliam RM, Tabatabaian Z, Royle A, Sealy BJ. (2005) 'The influence of the ion implantation temperature and the flux on smart-cut (c) in GaAs'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Taipei, TAIWAN: 15th International Conference on Ion Implantation Technology 237 (1-2), pp. 193-196.
    doi: 10.1016/j.nimb.2005.04.100
  • Hamilton JJ, Collart EJH, Colombeau B, Jeynes C, Bersani M, Giubertoni D, Sharp JA, Cowern NEB, Kirkby KJ. (2005) 'Electrical activation of solid-phase epitaxially regrown ultra-low energy boron implants in Ge preamorphised silicon and SOI'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Taipei, TAIWAN: 15th International Conference on Ion Implantation Technology 237 (1-2), pp. 107-112.
    doi: 10.1016/j.nimb.2005.04.112
  • Sharp JA, Gwilliam RM, Sealy BJ, Jeynes C, Hamilton JJ, Kirkby KJ. (2005) 'Comparison of elemental boron and boron halide implants into silicon'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Taipei, TAIWAN: 15th International Conference on Ion Implantation Technology 237 (1-2), pp. 93-97.
    doi: 10.1016/j.nimb.2005.04.084
  • Xu L, McNally PJ, Dilliway GDM, Cowern NEB, Jeynes C, Mendoza E, Ashburn P, Bagnall DM. (2005) 'Raman study of the strain and H-2 preconditioning effect on self-assembled Ge island on Si (001)'. SPRINGER JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, Univ Southampton, Southampton, ENGLAND: 5th International Conference on Materials for Microelectronics and Nanoengineering 16 (7), pp. 469-474.
    doi: 10.1007/s10854-005-2320-6
  • Peng NH, Jeynes C, Gwilliam RM, Kirkby KJ, Webb RP, Shao GS, Astill DA, Liang WY. (2005) 'A potential integrated low temperature approach for superconducting MgB2 thin film growth and electronics device fabrication by ion implantation'. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, Jacksonville, FL: 2004 Applied Superconductivity Conference 15 (2), pp. 3265-3268.
    doi: 10.1109/TASC.2005.848848
    Full text is available at: http://epubs.surrey.ac.uk/1279/
  • Mistry P, Gornez-Morilla I, Grime GW, Webb R, Jeynes C, Gwilliam R, Cansell A, Merchant M, Kirkby KJ. (2005) 'New developments on the Surrey microbeam applications to lithography'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Cavtat, CROATIA: 9th International Conference on Nuclear Microprobe Technology and Applications 231, pp. 428-432.
    doi: 10.1016/j.nimb.2005.01.095
  • Merchant MJ, Mistry P, Browton M, Clough AS, Gauntlett FE, Jeynes C, Kirkby KJ, Grime GW. (2005) 'Characterisation of the University of Surrey Ion Beam Centre in-air scanning microbeam'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Cavtat, CROATIA: 9th International Conference on Nuclear Microprobe Technology and Applications 231, pp. 26-31.
    doi: 10.1016/j.nimb.2005.01.029
  • Martinez FL, Ruiz-Merino R, del Prado A, San Andres E, Martil I, Gonzalez-Diaz G, Jeynes C, Barradas NP, Wang L, Reehal HS. (2004) 'Bonding structure and hydrogen content in silicon nitride thin films deposited by the electron cyclotron resonance plasma method'. ELSEVIER SCIENCE SA THIN SOLID FILMS, Berlin, GERMANY: 8th European Vacuum Congress (EVC-8)/2nd Annual Conference of the German-Vacuum-Society (DVG) 459 (1-2), pp. 203-207.
    doi: 10.1016/j.tsf.2003.12.084
  • Chakalov RA, Jeynes C, Mikheenko P, Allsworth MD, Darlington CNW, Colclough MS, Muirhead CM. (2004) 'Difference in individual layer properties in cuprate/manganite structures deposited by laser ablation'. WILEY-V C H VERLAG GMBH ANNALEN DER PHYSIK, AUGSBAURG, GERMANY: 10th International Workshop on Oxide Electronics 13 (1-2), pp. 81-82.
    doi: 10.1002/andp.200310056
  • Peng NH, Kang DJ, Jeynes C, Webb RP, Moore DF, Blamire MG, Chakarov IR. (2003) 'High quality YBa2Cu3O7-delta Josephson junctions and junction arrays fabricated by masked proton beam irradiation damage'. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, HOUSTON, TEXAS: Applied Superconductivity Conference 13 (2), pp. 889-892.
    doi: 10.1109/TASC.2003.814070
    Full text is available at: http://epubs.surrey.ac.uk/1267/
  • Kang DJ, Peng NH, Jeynes C, Webb R, Lee HN, Oh B, Moon SH, Burnell G, Stelmashenko NA, Tarte EJ, Moore DF, Blamire MG. (2003) 'Josephson effects in MgB2 metal masked ion damage junctions'. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, HOUSTON, TEXAS: Applied Superconductivity Conference 13 (2), pp. 1071-1074.
    doi: 10.1109/TASC.2003.814157
    Full text is available at: http://epubs.surrey.ac.uk/1280/
  • Dilliway GDM, Bagnall DM, Cowern NEB, Jeynes C. (2003) 'Self-assembled germanium islands grown on (001) silicon substrates by low-pressure chemical vapor deposition'. KLUWER ACADEMIC PUBL JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, ESPOO, FINLAND: 4th International Conference on Materials for Microelectronics and Nanoengineering 14 (5-7), pp. 323-327.
    doi: 10.1023/A:1023975928759
  • Webb RP, Winston SH, Gwilliam RM, Sealy BJ, Boudreault G, Jeynes C, Kirkby KJ. (2003) 'Comparison of boron halide, decaborane and B implants in Si from molecular dynamics simulations'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, DRESDEN, GERMANY: 6th International Conference on Computer Simulation of Radiation Effects in Solids 202, pp. 143-148.
    doi: 10.1016/S0168-583X(02)01844-X
  • Claudio G, Jeynes C, Kirkby KJ, Sealy BJ, Gwilliam R, Low R, Brown B, Alford TL, Nastasi M, Vella MC. (2003) 'Electrical behaviour of arsenic implanted silicon wafers at large tilt angle'. IEEE IIT2002: ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, TAOS, NM: 14th International Conference on Ion Implantation Technology, pp. 614-617.
    Full text is available at: http://epubs.surrey.ac.uk/2274/
  • Simon A, Sellin P, Lohstroh A, Jeynes C, Cullis AG, Midgley PA. (2003) 'Ion beam indneed charge microscopy imaging of CVD diamond'. IOP PUBLISHING LTD MICROSCOPY OF SEMICONDUCTING MATERIALS 2003, Univ Cambridge, Cambridge, ENGLAND: Conference on Microscopy of Semiconducting Materials (180), pp. 449-452.
  • Gennaro S, Sealy BJ, Jeynes C, Gwilliam R, Collart EJH, Licciardello A, Brown B, Alford TL, Nastasi M, Vella MC. (2003) 'Effects of carbon content and annealing conditions on the electrical activation of indium implanted silicon'. IEEE IIT2002: ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, TAOS, NM: 14th International Conference on Ion Implantation Technology, pp. 552-555.
  • Zurrug H, Mefo J, Sealy B, Boudreault G, Jeynes C, Webb RP, Kirkby KJ, Collart EJH, Brown B, Alford TL, Nastasi M, Vella MC. (2003) 'Characterization and enviromental impact of plasma products within an ion implanter'. IEEE IIT2002: ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, TAOS, NM: 14th International Conference on Ion Implantation Technology, pp. 471-474.
    Full text is available at: http://epubs.surrey.ac.uk/1257/
  • Winston SH, Gwilliam RM, Sealy BJ, Boudreault G, Jeynes C, Webb RP, Kirkby KJ, Brown B, Alford TL, Nastasi M, Vella MC. (2003) 'Evaluation of the Boron activation and depth distribution using BBr2+ implants'. IEEE IIT2002: ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, TAOS, NM: 14th International Conference on Ion Implantation Technology, pp. 115-118.
  • Mefo J, Kirkby KJ, Sealy BJ, Boudreault G, Jeynes C, Collart EJH, Brown B, Alford TL, Nastasi M, Vella MC. (2003) 'Elemental analysis of residual deposits in an ion implanter using IBA techniques'. IEEE IIT2002: ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, TAOS, NM: 14th International Conference on Ion Implantation Technology, pp. 467-470.
  • Claudio G, Boudreault G, Jeynes C, Sealy BJ, Low R, Brown B, Alford TL, Nastasi M, Vella MC. (2003) 'Absolute dose performance of the SWIFT single wafer ion implanter'. IEEE IIT2002: ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, TAOS, NM: 14th International Conference on Ion Implantation Technology, pp. 237-239.
    Full text is available at: http://epubs.surrey.ac.uk/1226/
  • Blamire MG, Kang DJ, Burnell G, Peng NH, Webb R, Jeynes C, Yun JH, Moon SH, Oh B. (2002) 'Masked ion damage and implantation for device fabrication'. PERGAMON-ELSEVIER SCIENCE LTD VACUUM, VARNA, BULGARIA: 12th International School on Vacuum, Electron and Ion Technologies 69 (1-3), pp. 11-15.
    doi: 10.1016/S0042-207X(02)00303-2
  • Peng NH, Jeynes C, Webb R, Chakarov I, Blamire M. (2002) 'Optimisation of masked ion irradiation damage profiles in YBCO thin films by Monte Carlo simulation'. ELSEVIER SCIENCE BV PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, TECH UNIV DENMARK, LYNGBY, DENMARK: 5th European Conference on Applied Superconductivity (EUCAS 2001) 372, pp. 55-58.
    doi: 10.1016/S0921-4534(02)00740-2
  • Milosavljevic M, Shao G, Bibic N, McKinty CN, Jeynes C, Homewood KP. (2002) 'Synthesis of amorphous FeSi2 by ion beam mixing'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, UNIV SURREY, GUILDFORD, ENGLAND: 7th European Conference on Accelerators in Applied Research and Technology 188, pp. 166-169.
    doi: 10.1016/S0168-583X(01)01068-0
  • Kang DJ, Peng NH, Webb R, Jeynes C, Burnell G, Yun JH, Moon SH, Oh B, Tarte EJ, Moore DF, Kelly M, Blamire MG. (2002) 'Irradiation damage technology for manufacturable Josephson junctions'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, UNIV SURREY, GUILDFORD, ENGLAND: 7th European Conference on Accelerators in Applied Research and Technology 188, pp. 183-188.
    doi: 10.1016/S0168-583X(01)01079-5
  • Peng NH, Jeynes C, Webb R, Chakarov I, Kang DJ, Moore D, Blamire M. (2002) 'Monte Carlo simulations of energetic proton beam irradiation damage defect productions in YBCO thin films with Au masks'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, UNIV SURREY, GUILDFORD, ENGLAND: 7th European Conference on Accelerators in Applied Research and Technology 188, pp. 189-195.
    doi: 10.1016/S0168-583X(01)01080-1
  • Breese MBH, de Kerckhove DG, Jeynes C, Peel RMA, Murray CW. (2001) 'An electrostatic beam rocking system on the Surrey nuclear microprobe'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, BORDEAUX, FRANCE: 7th International Conference on Nuclear Microprobe Technology and Applications 181, pp. 54-59.
    doi: 10.1016/S0168-583X(01)00615-2
  • Peng NH, Jeynes C, Webb RP, Chakarov IR, Blamire MG. (2001) 'Monte Carlo simulations of masked ion beam irradiation damage profiles in YBa2Cu3O7-delta thin films'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, STRASBOURG, FRANCE: E-MRS Spring Meeting on Materials Science with Ion Beams 178, pp. 242-246.
    doi: 10.1016/S0168-583X(00)00471-7
  • Milosavljevic M, Shao G, Gwilliam RM, Jeynes C, McKinty CN, Homewood KP. (2001) 'Properties of beta-FeSi2 grown by combined ion irradiation and annealing of Fe/Si bilayers'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, CANELA, BRAZIL: 12th International Conference on Ion Beam Modification of Materials (IBMM2000) 175, pp. 309-313.
    doi: 10.1016/S0168-583X(00)00639-X
  • Kahlmann F, Booij WE, Blamire MG, McBrien PF, Peng NH, Jeynes C, Romans EJ, Pegrum CM, Tarte EJ. (2001) 'Performance of high-T-c dc SQUID magnetometers with resistively shunted inductances compared to "unshunted" devices'. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, VIRGINIA BEACH, VIRGINIA: 2000 Applied Superconductivity Conference 11 (1), pp. 916-919.
    doi: 10.1109/77.919494
  • Kang DJ, Speaks R, Peng NH, Webb R, Jeynes C, Booij WE, Tarte EJ, Moore DF, Blamire MG. (2001) 'Nanometer scale masked ion damage barriers in YBa2Cu3O7-delta'. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, VIRGINIA BEACH, VIRGINIA: 2000 Applied Superconductivity Conference 11 (1), pp. 780-783.
    doi: 10.1109/77.919461
    Full text is available at: http://epubs.surrey.ac.uk/732932/
  • Peng NH, Chakarov I, Jeynes C, Webb R, Booij W, Blamire M, Kelly M. (2000) '2D Monte Carlo simulation of proton implantation of superconducting YBa2Cu3O7-delta thin films through high aspect ratio Nb masks'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ODENSE, DENMARK: 18th International Conference on Atomic Collisions in Solids (ICACS-18) 164, pp. 979-985.
    doi: 10.1016/S0168-583X(99)01194-5
  • Peaker AR, Evans-Freeman JH, Kan PYY, Hawkins ID, Terry J, Jeynes C, Rubaldo L. (2000) 'Vacancy-related defects in ion implanted and electron irradiated silicon'. ELSEVIER SCIENCE SA MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, STRASBOURG, FRANCE: Symposium F: Process Induced Defects in Semiconductors at the 1999 Spring Meeting of the European-Materials-Research-Society 71, pp. 143-147.
    doi: 10.1016/S0921-5107(99)00364-5
  • Riley LS, Hall S, Harris J, Fernandez J, Gallas B, Evans AGR, Clarke JF, Humphrey J, Murray RT, Jeynes C. (1999) 'SiGe nMOSFETs with gate oxide grown by low temperature plasma anodisation'. ELSEVIER SCIENCE BV MICROELECTRONIC ENGINEERING, KLOSTER BANZ, GERMANY: 11th Biennial Conference on Insulating Films on Semiconductors 48 (1-4), pp. 227-230.
    doi: 10.1016/S0167-9317(99)00376-7
  • Taylor JW, Saleh AS, Rice-Evans PC, Knights AP, Jeynes C. (1999) 'Depth profiling of defects in nitrogen implanted silicon using a slow positron beam'. ELSEVIER SCIENCE BV APPLIED SURFACE SCIENCE, CAPE TOWN, SOUTH AFRICA: 8th International Workshop on Slow-Positron Beam Techniques for Solids and Surfaces (SLOPOS-8) 149 (1-4), pp. 175-180.
    doi: 10.1016/S0169-4332(99)00196-8
  • Booij WE, Elwell CA, Tarte EJ, McBrien PF, Kahlmann F, Moore DF, Blamire MG, Peng NH, Jeynes C. (1999) 'Electrical properties of electron and ion beam irradiated YBa2Cu3O7-delta'. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, PALM DESERT, CALIFORNIA: 1998 Applied Superconductivity Conference 9 (2), pp. 2886-2889.
    doi: 10.1109/77.783632
  • Barradas NP, Jeynes C, Kusano Y, Evetts JE, Hutchings IM, Duggan JL, Morgan IL. (1999) 'RBS/simulated annealing and FTIR characterisation of BCN films deposited by dual cathode magnetron sputtering'. AMER INST PHYSICS APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, UNIV N TEXAS, DENTON, TX: 15th International Conference on the Application of Accelerators in Research and Industry 475, pp. 504-507.
  • Toal SJ, Reehal HS, Barradas NP, Jeynes C. (1999) 'Growth of microcrystalline beta-SiC films on silicon by ECR plasma CVD'. ELSEVIER SCIENCE BV APPLIED SURFACE SCIENCE, STRASBOURG, FRANCE: Symposium on Surface Processing - Laser, Lamp, Plasma, at the Annual Spring Meeting of the European-Materials-Society (E-MRS 96) 138, pp. 424-428.
    doi: 10.1016/S0169-4332(98)00435-8
  • Way AS, Jeynes C, Webb RP. (1999) 'Measurement of lateral stress in argon implanted thin gold films using quartz resonator techniques'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ROYAL TROP INST, AMSTERDAM, NETHERLANDS: 11th International Conference on Ion Beam Modification of Materials (IBMM98) 148 (1-4), pp. 238-241.
    doi: 10.1016/S0168-583X(98)00879-9
  • Kozanecki A, Jeynes C, Barradas NP, Sealy BJ, Jantsch W. (1999) 'The influence of implantation and annealing conditions on optical activity of Er3+ ions in 6H SiC'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ROYAL TROP INST, AMSTERDAM, NETHERLANDS: 11th International Conference on Ion Beam Modification of Materials (IBMM98) 148 (1-4), pp. 512-516.
    doi: 10.1016/S0168-583X(98)00708-3
  • Marriott PK, Jenkin M, Jeynes C, Barradas NP, Webb RP, Sealy BJ, Duggan JL, Morgan IL. (1999) 'Rapid accurate automated analysis of complex ion beam analysis data'. AMER INST PHYSICS APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, UNIV N TEXAS, DENTON, TX: 15th International Conference on the Application of Accelerators in Research and Industry 475, pp. 592-595.
  • Naveed AT, Huda MQ, Abd El-Rahman KF, Hartung J, Evans-Freeman JH, Peaker AR, Houghton DC, Jeynes C, Gillin WP. (1998) 'Erbium in silicon-germanium quantum wells'. ELSEVIER SCIENCE BV JOURNAL OF LUMINESCENCE, STRASBOURG, FRANCE: Symposium on Light Emission from Silicon - Procress Towards Si-based Optoelectronics at the Spring Meeting of the European-Materials-Research-Society 80 (1-4), pp. 381-386.
    doi: 10.1016/S0022-2313(98)00133-1
  • Sealy B, Gwilliam R, Shannon J, Jeynes C, Angelov C, Tsvetkova T. (1998) 'Surface electrical conductivity of Co+-implanted a-SiC : H films'. PERGAMON-ELSEVIER SCIENCE LTD VACUUM, VARNA, BULGARIA: 10th International Summer School on Vacuum, Electron and Ion Technologies (VEIT 97) 51 (2), pp. 281-284.
    doi: 10.1016/S0042-207X(98)00175-4
  • Nejim A, Barradas NP, Jeynes C, Cristiano F, Wendler E, Gartner K, Sealy BJ. (1998) 'Residual post anneal damage of Ge and C co-implantation of Si determined by quantitative RBS-channelling'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, EINDHOVEN UNIV, EINDHOVEN, NETHERLANDS: 5th European Conference on Accelerators in Applied Research and Technology (ECAART5) 139 (1-4), pp. 244-248.
    doi: 10.1016/S0168-583X(97)00966-X
  • Bibic N, Milosavljevic M, Perusko D, Jeynes C. (1998) 'Investigation of ion beam mixing effects in Ta/Pd bilayers deposited on Si'. ELSEVIER SCIENCE SA THIN SOLID FILMS, UNIV SALAMANCA, SALAMANCA, SPAIN: 5th European Vacuum Conference (EVC 5) / 10th International Conference on Thin Films (ICTF 10) 317 (1-2), pp. 274-277.
    doi: 10.1016/S0040-6090(97)00528-2
  • Kozanecki A, Jeynes C, Sealy BJ, Nejim A. (1998) 'Ion beam analysis of 6H SiC implanted with erbium and ytterbium ions'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, LISBON, PORTUGAL: 13th International Conference on Ion Beam Analysis (IBA-13) 136, pp. 1272-1276.
    doi: 10.1016/S0168-583X(97)00828-8
  • Jeynes C, Barradas NP, Blewett MJ, Webb RP. (1998) 'Improved ion beam analysis facilities at the University of Surrey'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, LISBON, PORTUGAL: 13th International Conference on Ion Beam Analysis (IBA-13) 136, pp. 1229-1234.
    doi: 10.1016/S0168-583X(97)00818-5
  • Barradas NP, Marriott PK, Jeynes C, Webb RP. (1998) 'The RBS data furnace: Simulated annealing'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, LISBON, PORTUGAL: 13th International Conference on Ion Beam Analysis (IBA-13) 136, pp. 1157-1162.
    doi: 10.1016/S0168-583X(97)00808-2
  • Kozanecki A, Jeynes C, Sealy BJ, Jantsch W, Lanzerstorfer S, Heiss W, Prechtl G, Pensl G, Morkoc H, Monemar B, Janzen E. (1998) 'Photoluminescence and backscattering characterization of 6H SiC implanted with erbium and oxygen ions'. TRANSTEC PUBLICATIONS LTD SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, STOCKHOLM, SWEDEN: 7th International Conference on Silicon Carbide, III-Nitrides and Related Materials (ICSCIII-N 97) 264-2, pp. 501-504.
  • Puttick K, Jeynes C, Gee T. (1998) 'Surface amorphization of machined silicon'. AMER SOC PRECISION ENGINEERING PROCEEDINGS OF: SILICON MACHINING, CARMEL BY THE SEA, CA: 1998 Spring Topical Meeting of the ASPE on Silicon Machining, pp. 15-18.
  • Stojanovic M, Milosavljevic M, Jeynes C, Uskokovic DP, Milonjic SK, Rakovic DI. (1998) 'Characterization of as implanted silicides by frequency noise level measurements'. TRANSTEC PUBLICATIONS LTD ADVANCED MATERIALS AND PROCESSES, HERCEG-NOVI, YUGOSLAVIA: 2nd Yugoslav Conference on Advanced Materials (YUGOMAT II) 282-2, pp. 153-156.
  • Kozanecki N, Jantsch W, Heis W, Prechtl G, Sealy BJ, Jeynes C. (1997) 'Infrared luminescence in Er and Er+O implanted 6H SiC'. POLISH ACAD SCIENCES INST PHYSICS ACTA PHYSICA POLONICA A, JASZOWIEC, POLAND: XXVI International School on Physics of Semiconducting Compounds 92 (5), pp. 879-882.
  • Murtagh M, Lynch SM, Kelly PV, Hildebrant S, Herbert PAF, Jeynes C, Crean GM. (1997) 'Photoreflectance characterisation of Ar+ ion etched and SiCl4 reactive ion etched silicon (100)'. INST MATERIALS MATERIALS SCIENCE AND TECHNOLOGY, BARCELONA, SPAIN: 1st International Conference on Materials for Microelectronics 13 (11), pp. 961-964.
  • Mironov OA, Phillips PJ, Parker EHC, Dowsett MG, Barradas NP, Jeynes C, Mironov M, Gnezdilov VP, Ushakov V, Eremenko VV. (1997) 'Structural and optical characterisation of undoped Si-Si0.78Ge0.22/Si(001) superlattices grown by MBE'. ELSEVIER SCIENCE SA THIN SOLID FILMS, WARSAW, POLAND: Workshop on Molecular Beam Expitaxy-Growth Physics and Technology (MBE-GPT 96) 306 (2), pp. 307-312.
    doi: 10.1016/S0040-6090(97)00240-X
  • DeSouza RA, Kilner JA, Jeynes C. (1997) 'The application of secondary ion mass spectrometry (SIMS) to the study of high temperature proton conductors (HTPC)'. ELSEVIER SCIENCE BV SOLID STATE IONICS, GOL, NORWAY: VIII International Conference on Solid State Protonic Conductors 97 (1-4), pp. 409-419.
    doi: 10.1016/S0167-2738(97)00038-6
  • Nejim A, Jeynes C, Webb RP, Cowern NEB, Patel CJ, delaRubia TD, Coffa S, Stolk PA, Rafferty CS. (1997) 'Influence of dynamic annealing on the depth distribution of germanium implanted in (100) silicon at elevated temperatures'. MATERIALS RESEARCH SOCIETY DEFECTS AND DIFFUSION IN SILICON PROCESSING, SAN FRANCISCO, CA: Symposium on Defects and Diffusion in Silicon Processing 469, pp. 387-393.
  • Wilson IH, Chen YJ, Xu JB, Devine RAB, Jeynes C. (1996) 'Ion impacts and nanostructures on Ge(111), In0.22Ga0.78As/GaAs(100) and alpha quartz surfaces observed by atomic force microscopy'. JOHN WILEY & SONS LTD SURFACE AND INTERFACE ANALYSIS, GUILDFORD, ENGLAND: QSA-9 Conference 24 (13), pp. 881-886.
    doi: 10.1002/(SICI)1096-9918(199612)24:13<881::AID-SIA198>3.3.CO;2-T
  • Li YP, Kilner JA, Tate TJ, Chater RJ, Jeynes C, Jafri ZH. (1996) 'SIMS, RBS, and ion channelling studies of H-2(+) or O-18(+) irradiated LaAlO3, (100) single crystal'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ARIZONA STATE UNIV CAMPUS, TEMPE, AZ: 12th International Conference on Ion Beam Analysis (IBA-12) 118 (1-4), pp. 133-138.
    doi: 10.1016/0168-583X(95)01201-X
  • Stojanovic M, Jeynes C, Bibic N, Milosavljevic M, Vasic A, Milosevic Z. (1996) 'Frequency noise level of as ion implanted TiN-Ti-Si structures'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, LINZ, AUSTRIA: 16th International Conference on Atomic Collisions in Solids (ICACS-16) 115 (1-4), pp. 554-556.
    doi: 10.1016/0168-583X(95)01533-7
  • Stojanovic M, Vasic A, Jeynes C. (1996) 'Ion implanted silicides studies by frequency noise level measurements'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, STRASBOURG, FRANCE: Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation/Symposium C on Pushing the Limits of Ion Beam Processing - From Engineering to Atomic Scale Issues, at the E-MRS 95 Spring Meeting 112 (1-4), pp. 192-195.
    doi: 10.1016/0168-583X(95)01281-8
  • MILOSAVLJEVIC M, BIBIC N, PERUSKO D, JEYNES C. (1995) 'INFLUENCE OF ARSENIC ION-IMPLANTATION ON THE FORMATION OF TI-SILICIDES'. PERGAMON-ELSEVIER SCIENCE LTD VACUUM, UPPSALA, SWEDEN: 4th European Vacuum Conference (EVC-4)1st Swedish Vacuum Meeting (SVM-1) 46 (8-10), pp. 1009-1012.
    doi: 10.1016/0042-207X(95)00094-1
  • BACHMANN T, WENDLER E, WESCH W, HERRE O, WILSON RJ, JEYNES C, GWILLIAM RM, SEALY BJ. (1995) 'DAMAGE PRODUCTION DURING MEV ION-IMPLANTATION IN GAAS AND INAS'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, DENTON, TX: 13th International Conference on the Application of Accelerators in Research and Industry 99 (1-4), pp. 619-622.
    doi: 10.1016/0168-583X(94)00565-6
  • WENDLER E, WILSON RJ, JEYNES C, WESCH W, GARTNER K, GWILLIAM RM, SEALY BJ. (1995) '2 MEV AS+ IMPLANTATION IN INAS'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, CATANIA, ITALY: 10th International Conference on Ion Implantation Technology 96 (1-2), pp. 298-301.
    doi: 10.1016/0168-583X(94)00504-4
  • YOUSIF KM, SMITH BE, JEYNES C. (1994) 'STUDY OF DURABILITY OF (MOLYBDENUM-COPPER)-BLACK COATINGS IN RELATION TO THEIR USE AS SOLAR SELECTIVE ABSORBERS'. PERGAMON-ELSEVIER SCIENCE LTD RENEWABLE ENERGY, READING, ENGLAND: World Renewable Energy Congress - Climate Change, Energy and the Environment 5 (1-4), pp. 324-329.
    doi: 10.1016/0960-1481(94)90390-5
  • KOZANECKI A, SEALY BJ, JEYNES C, GILLIN WP, GREY R. (1994) 'INTERDIFFUSION AND THERMALLY-INDUCED STRAIN RELAXATION IN GAAS/IN0.2GA0.8AS/GAAS SINGLE-QUANTUM-WELL STRUCTURES'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, BALATONFURED, HUNGARY: 11th International Conference on Ion Beam Analysis (IBA-11) 85 (1-4), pp. 192-196.
    doi: 10.1016/0168-583X(94)95812-2
  • PEEL RMA, MILLEN D, JEYNES C, WEBB RP, Miles R, Chalmers A. (1994) 'TRANSPUTERS IN A DISTRIBUTED DATA-COLLECTION SYSTEM FOR MEV ION MICROBEAM ANALYSIS'. I O S PRESS PROGRESS IN TRANSPUTER AND OCCAM RESEARCH, BRISTOL, ENGLAND: 17th World-Occam-and-Transputer-User-Group Technical Meeting 38, pp. 87-97.
  • LYNCH S, MURTAGH M, CREAN GM, KELLY PV, OCONNOR M, JEYNES C. (1993) 'NONDESTRUCTIVE DEPTH PROFILING OF SILICON ION-IMPLANTATION INDUCED DAMAGE IN SILICON (100) SUBSTRATES'. ELSEVIER SCIENCE SA LAUSANNE THIN SOLID FILMS, MINIST RECH & ESPACE, PARIS, FRANCE: 1ST INTERNATIONAL CONF ON SPECTROSCOPIC ELLIPSOMETRY 233 (1-2), pp. 199-202.
    doi: 10.1016/0040-6090(93)90089-8
  • KING BV, JEYNES C, WEBB RP, KILNER JA. (1993) 'ION-BEAM MIXING OF ISOTOPIC SILVER BILAYERS BY 200 KEV GERMANIUM'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, HEIDELBERG, GERMANY: 8TH INTERNATIONAL CONF ON ION BEAM MODIFICATION OF MATERIALS 80-1, pp. 163-166.
    doi: 10.1016/0168-583X(93)96098-W
  • HEMMENT PLF, SEALY BJ, STEPHENS KG, MYNARD JE, JEYNES C, BROWTON MD, WILSON RJ, MA MX, CANSELL A, MOUS DJW, KOUDIJS R. (1993) 'A 2-MV HEAVY-ION VANDEGRAAFF IMPLANTER FOR RESEARCH-AND-DEVELOPMENT'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, UNIV FLORIDA, GAINESVILLE, FL: 9TH INTERNATIONAL CONF ON ION IMPLANTATION TECHNOLOGY 74 (1-2), pp. 27-31.
    doi: 10.1016/0168-583X(93)95009-T
  • BIBIC N, MILOSAVLJEVIC M, PERUSKO D, SERRUYS Y, JEYNES C. (1992) 'ION-BEAM INDUCED MIXING IN PD THIN-FILMS ON SILICON'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, UNIV SALFORD, SALFORD, ENGLAND: 14TH INTERNATIONAL CONF ON ATOMIC COLLISIONS IN SOLIDS ( ICACIS-14 ) 67 (1-4), pp. 500-503.
    doi: 10.1016/0168-583X(92)95860-T
  • MURTAGH M, CREAN GM, FLAHERTY T, JEYNES C. (1992) 'SENSITIVITY OF A MODULATED OPTICAL REFLECTANCE PROBE TO PROCESS-INDUCED LATTICE DISORDER'. ELSEVIER SCIENCE BV APPLIED SURFACE SCIENCE, STRASBOURG, FRANCE: SYMP OF THE 1991 SPRING CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : LASER SURFACE PROCESSING AND CHARACTERIZATION 54, pp. 497-501.
    doi: 10.1016/0169-4332(92)90094-E
  • CURRENT MI, GUITNER T, OHNO N, HURLEY K, KEENAN WA, JOHNSON W, HILLARD RJ, JEYNES C. (1991) 'MONITORING THE MICRO-UNIFORMITY PERFORMANCE OF A SPINNING DISK IMPLANTER'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, UNIV SURREY, GUILDFORD, ENGLAND: 8TH INTERNATIONAL CONF ON ION IMPLANTATION TECHNOLOGY 55 (1-4), pp. 173-177.
    doi: 10.1016/0168-583X(91)96156-F
  • MILOSAVLJEVIC M, BIBIC N, PERUSKO D, WILSON IH, JEYNES C. (1990) 'PROCESSING OF TIN/TI METALLIZATION ON SILICON BY ARSENIC ION-IMPLANTATION'. ELSEVIER SCIENCE SA LAUSANNE SURFACE & COATINGS TECHNOLOGY, SAN DIEGO, CA: 17TH INTERNATIONAL CONF ON METALLURGICAL COATINGS / 8TH INTERNATIONAL CONF ON THIN FILMS 43-4 (1-3), pp. 996-1006.
    doi: 10.1016/0257-8972(90)90038-E
  • REESON KJ, STANLEY CJ, JEYNES C, GRIME G, WATT F. (1990) 'PIXE ANALYSIS TO DETERMINE THE TRACE-ELEMENT CONCENTRATIONS IN A SERIES OF GALENA (PBS) SPECIMENS FROM DIFFERENT LOCALITIES'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, QUEENS UNIV, KINGSTON, CANADA: 9TH INTERNATIONAL CONF ON ION BEAM ANALYSIS 45 (1-4), pp. 327-332.
    doi: 10.1016/0168-583X(90)90845-L
  • SINGH M, LIGHTOWLERS EC, DAVIES G, JEYNES C, REESON KJ. (1989) 'ISOELECTRONIC BOUND EXCITON PHOTOLUMINESCENCE FROM A METASTABLE DEFECT IN SULFUR-DOPED SILICON'. ELSEVIER SCIENCE SA LAUSANNE MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, COUNCIL EUROPE & EUROPEAN PARLIAMENT, STRASBOURG, FRANCE: SYMP AT THE 1989 SPRING MEETING OF THE EUROPEAN MATERIALS SOC : SCIENCE AND TECHNOLOGY OF DEFECTS IN SILICON 4 (1-4), pp. 303-307.
    doi: 10.1016/0921-5107(89)90262-6
  • JEYNES C. (1989) 'NOVEL APPLICATIONS OF ION-IMPLANTATION'. PERGAMON-ELSEVIER SCIENCE LTD VACUUM, UNIV SURREY, GUILDFORD, ENGLAND: 5TH INTERNATIONAL CONF ON LOW ENERGY ION BEAMS 39 (11-12), pp. 1047-1056.
    doi: 10.1016/0042-207X(89)91091-9

Book chapters

  • Jeynes C, Barradas NP. (2009) 'Pitfalls in Ion Beam Analysis'. in Wang Y, Nastasi MA (eds.) Handbook of Modern Ion Beam Materials Analysis 2nd Edition. Warrendale Pennsylvania : Materials Research Society Article number 15 , pp. 347-383.
    Full text is available at: http://epubs.surrey.ac.uk/715433/

    Abstract

    Accurate elemental depth profiling by IBA is of great value to many modern thin-film technologies. IBA is a quantitative analytical technique now capable of traceable accuracy below 1%. In this chapter we describe sources of errors in data collection and analysis (pitfalls) greater than about 1/4%.

Software

  • Jeynes C, Barradas NP, Webb RP. (1997) DataFurnace for Ion Beam Analysis. University of Surrey Ion Beam Centre

Chris Jeynes's Other Interests and Links

Doubtless few will wish to know,  but this is a good place to put this stuff!

Science and Creation (and the Higgs Boson)

    "Science and Creation" (2002, 72pp, 451kb PDF) is my abridgement of Stanley Jaki's 1974 book of the same name.  It is a full-scale historical demonstration of the opinion that is now widespread among historians of science,  that Christian belief underpins the scientific method.  Scientists believe that the world ("the Universe") is not unintelligible in principle,  and moreover that we are capable of understanding it.  This corresponds to the Christian beliefs that God is not capricious,  and that we are made "in the image of God",  that is,  able to appreciate God's handiwork.  Putting it another way,  God is rational,  and people matter.

     In particular,  Jaki is interested in the philosophical attitudes to time in the various civilizations he considers,  and the enormous philosophical importance of the Christian insistence on finite time.  (He considers Islam at length,  from a philosophical point of view -- the Muslims also believe in Creation and the Day of Judgement;  but he concludes that they never succeeded in shedding their Aristotelianism - Aristotle insisted that time must necessarily be infinite in extent.)  

     I think that this is an important basic book,  but that Jaki's expression was rather obscure (and also presupposed rather a lot of knowledge of the reader).  I have tried to clarify and simplify it and hope that some may find this abridgement useful.

     The Higgs Boson,  (unofficially) reported by CERN in July 2012,  is sometimes referred to as the "God particle" - not for very good reasons,  except that it could be considered to represent our current model of the Universe.  On the Higgs Boson (3rd September 2012, 78 kb PDF) is a very simple "explanation" of it,  together with reasons for Christians to be interested in it.

A Christian Cosmogony (on creation and creationism)

    Cosmogony is an account of the creation of the universe,  where cosmogeny is an account of the evolution of the universe.  "A Christian Cosmogony" (2010, 19pp, 212 kb PDF) is a wide-ranging essay considering how to read the Creation accounts in Genesis.  I think that a correct reading is one that the original author(s) would have recognised and is,  rather surprisingly, completely consistent with modern cosmology. 

     Curiously,  although many assert that religious beliefs are not falsifiable in a Popperian sense,  it turns out that a central assertion of the monotheistic faiths (Judaism,  Christianity,  Islam),  the Creation,  is now conventional wisdom in physics.  The Big Bang theory is supported by the standard theory of the Cosmic Microwave Background with the resulting observed H/He ratio in the universe,  and the observed abundance of isotopes explained by stellar nucleosynthesis.  The singular nature of the Big Bang is emphasised theoretically by the Penrose/Hawking gravitational collapse theorem of 1970.  Thus,  the Christian assertion of Creation can reasonably be said to be proved!

    Although I firmly believe (with all physicists,  mutatis mutandis) in Creation,  I am emphatically not a "creationist" insisting on a literalist reading of Genesis.  This is explained in detail in a review of an unashamedly creationist book: "Creation & Change" (D.F.Kelly,  1997;  2012, 7pp, 84 kb PDF) which conclude is "a bad book ... full of foolish nonsense."

The Historicity of the Gospels

    The question of what happened at Easter is central to Christian belief.  Is the story of the death and resurrection of Jesus historical?  We have the testimony of the Evangelists as the primary evidence,  are the Gospels reliable?  These questions are investigated in an essay on the first part of the passion narrative in the Gospel of John (John chapter 18:  2012, 19pp, 190 kb PDF).

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