Dr Fernando Araujo de Castro is leading work at NPL on metrology to support photovoltaics and organic and printed electronics. His work focuses on developing measurement solutions to support materials and product development in three broad areas: performance (from nano- to macroscale), durability and large-area characterisation.

He joined NPL in January 2010, where he is now a Principal Research Scientist and currently coordinates a large European Metrology project (EMRP Thin Films) involving 15 partners from eight countries.

Fernando has published over 30 papers, two patent applications and several conference presentations related to organic thin film devices, including light emitting diodes, solar cells and electronic memories.