Dr Melanie Bailey

Lecturer in Analytical and Forensic Science

Email: m.bailey@surrey.ac.uk
Phone: Work: 01483 68 2593
Room no: 35 AZ 03

Office hours

Monday to Thursday

Biography
Publications
Teaching
Duties

Biography

Dr. Melanie Bailey is a Lecturer in Chemistry at the University of Surrey, where she lectures on Analytical Chemistry and Forensics. She obtained her Bsc. in Physics in 2001 from the University of Manchester and her PhD in Electrical Engineering from the University of Surrey Ion Beam Centre.

Her research interests fit broadly into two themes: the application of new techniques in forensic science and the characterization of materials using ion beams.

Over the last three years, Dr. Bailey has been developing ion beam analysis methodology for the analysis of trace evidence collected from crime scenes such as gunshot residue particles, soils, fibres, paints and glass and has demonstrated that the techniques can offer enhanced sensitivity compared with other non-destructive methods of analysis. Further research is now ongoing to investigate what evidential value this enhanced sensitivity can offer and how useful it is in discriminating samples from different sources. Key collaborators include the Jill Dando Institute for Crime Science, University of Oxford, LGC Forensics, the University of Lausanne and the Italian Carabinieri. The results of these studies have been featured in a variety of technical publications as well as The Guardian, ITV News, BBC Radio and Scientific American.

Dr. Bailey is currently running an inter-comparison study of techniques that can be used to detect and measure molecules present in latent fingerprints, involving the Home Office and police forces and academics from across the nation. Latent fingerprints have a great potential to offer extra information about an offender (e.g. based on sex, ethnicity, drug use, diet), which could be particularly useful if that offender is not on the fingerprint database.

She is Hon. Secretary of the Ion and Plasma Surface Interactions Group at the Institute of Physics (IoP) and is currently involved in making a short film for the IoP on her research which will be used to promote physics to the general public.

Publications

Highlights

Bailey MJ, Morgan RM, Comini P, Calusi S, Bull PA. (2012) 'Evaluation of particle-induced X-ray emission and particle-induced γ-ray emission of quartz grains for forensic trace sediment analysis.'. Anal Chem, United States: 84 (5), pp. 2260-2267.
doi: 10.1021/ac2028722
Bright NJ, Webb RP, Bleay S, Hinder S, Ward N, Watts JF, Kirkby KJ, Bailey MJ. (2012) 'Determination of the deposition order of overlapping latent fingerprints and inks using Secondary Ion Mass Spectrometry (SIMS)'. ACS Publications Analytical Chemistry,
doi: 10.1021/ac300185j
Bailey MJ, Jones BN, Hinder S, Watts J, Bleay S, Webb RP. (2010) 'Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Cambridge, Cambridge, ENGLAND: 19th International Conference on Ion Beam Analysis 268 (11-12), pp. 1929-1932.
doi: 10.1016/j.nimb.2010.02.104
Bailey MJ, Coe S, Grant DM, Grime GW, Jeynes C. (2009) 'Accurate determination of the Ca : P ratio in rough hydroxyapatite samples by SEM-EDS, PIXE and RBS - a comparative study'. JOHN WILEY & SONS LTD X-RAY SPECTROMETRY, Cavtat, CROATIA: 38 (4), pp. 343-347.
doi: 10.1002/xrs.1171
Bailey MJ, Kirkby KJ, Jeynes C. (2009) 'Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study'. JOHN WILEY & SONS LTD X-RAY SPECTROMETRY, Cavtat, CROATIA: 13th European X-Ray Spectrometry Conference (EXRS 2008) 38 (3), pp. 190-194.
doi: 10.1002/xrs.1142
Webb M, Jeynes C, Gwilliam RM, Tabatabaian Z, Royle A, Sealy BJ. (2005) 'The influence of the ion implantation temperature and the flux on smart-cut (c) in GaAs'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Taipei, TAIWAN: 15th International Conference on Ion Implantation Technology 237 (1-2), pp. 193-196.
doi: 10.1016/j.nimb.2005.04.100

Journal articles

Ugarte M, Grime GW, Lord G, Geraki K, Collingwood JF, Finnegan ME, Farnfield H, Merchant M, Bailey MJ, Ward NI, Foster PJ, Bishop PN, Osborne NN. (2012) 'Concentration of various trace elements in the rat retina and their distribution in different structures.'. Metallomics, England: 4 (12), pp. 1245-1254.
doi: 10.1039/c2mt20157g
Wakeling BR, Degamber B, Kister G, Lane DW, Bailey MJ, Jeynes C. (2012) 'In situ analysis of cadmium sulphide chemical bath deposition by an optical fibre monitor'. Thin Solid Films, 525, pp. 1-5.
doi: 10.1016/j.tsf.2012.07.109
Jeynes C, Bailey MJ, Bright NJ, Christopher ME, Grime GW, Jones BN, Palitsin VV, Webb RP. (2012) '"total IBA" - Where are we?'. Elsevier Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 271, pp. 107-118.
doi: 10.1016/j.nimb.2011.09.020
Full text is available at: http://epubs.surrey.ac.uk/715435/

Abstract

The suite of techniques which are available with the small accelerators used for MeV ion beam analysis (IBA) range from broad beams, microbeams or external beams using the various particle and photon spectrometries (including RBS, EBS, ERD, STIM, PIXE, PIGE, NRA and their variants), to tomography and secondary particle spectrometries like MeV-SIMS. These can potentially yield almost everything there is to know about the 3-D elemental composition of types of samples that have always been hard to analyse, given the sensitivity and the spacial resolution of the techniques used. Molecular and chemical information is available in principle with, respectively, MeV-SIMS and high resolution PIXE. However, these techniques separately give only partial information – the secret of “Total IBA” is to find synergies between techniques used simultaneously which efficiently give extra information. We here review how far “Total IBA” can be considered already a reality, and what further needs to be done to realise its full potential.
Bailey MJ, Bright NJ, Croxton RS, Francese S, Ferguson LS, Hinder S, Jickells S, Jones BJ, Jones BN, Kazarian SG, Ojeda JJ, Webb RP, Wolstenholme R, Bleay S. (2012) 'Chemical characterization of latent fingerprints by matrix-assisted laser desorption ionization, time-of-flight secondary ion mass spectrometry, mega electron volt secondary mass spectrometry, gas chromatography/mass spectrometry, X-ray photoelectron spectroscopy, and attenuated total reflection Fourier transform infrared spectroscopic imaging: an intercomparison.'. Anal Chem, United States: 84 (20), pp. 8514-8523.
doi: 10.1021/ac302441y
Bright NJ, Webb R, Hinder SJ, Kirkby KJ, Ward NI, Watts JF, Bleay S, Bailey MJ. (2012) 'Determination of the deposition order of overlapping latent fingerprints and inks using Secondary Ion Mass Spectrometry (SIMS).'. American Chemical Society Anal Chem, 84 (9), pp. 4083-4087.
doi: 10.1021/ac300185j
Bailey MJ, Morgan RM, Comini P, Calusi S, Bull PA. (2012) 'Evaluation of particle-induced X-ray emission and particle-induced γ-ray emission of quartz grains for forensic trace sediment analysis.'. Anal Chem, United States: 84 (5), pp. 2260-2267.
doi: 10.1021/ac2028722
Wakeling BR, Degamber B, Kister G, Lane DW, Bailey MJ, Jeynes C. (2012) 'In situ analysis of cadmium sulphide chemical bath deposition by an optical fibre monitor'. Thin Solid Films,
doi: 10.1016/j.tsf.2012.07.109
Bright NJ, Webb RP, Bleay S, Hinder S, Ward N, Watts JF, Kirkby KJ, Bailey MJ. (2012) 'Determination of the deposition order of overlapping latent fingerprints and inks using Secondary Ion Mass Spectrometry (SIMS)'. ACS Publications Analytical Chemistry,
doi: 10.1021/ac300185j
Shcherbachev K, Bailey MJ. (2011) 'Influence of implantation conditions of He+ ions on the structure of a damaged layer in GaAs(001)'. Physica Status Solidi (A) Applications and Materials, 208 (11), pp. 2576-2581.
doi: 10.1002/pssa.201184259
Campana MG, Bower MA, Bailey MJ, Stock F, O'Connell TC, Edwards CJ, Checkley-Scott C, Knight B, Spencer M, Howe CJ. (2010) 'A flock of sheep, goats and cattle: ancient DNA analysis reveals complexities of historical parchment manufacture'. ACADEMIC PRESS LTD- ELSEVIER SCIENCE LTD JOURNAL OF ARCHAEOLOGICAL SCIENCE, 37 (6), pp. 1317-1325.
doi: 10.1016/j.jas.2009.12.036
Kaabar W, Daar E, Bunk O, Farquharson MJ, Laklouk A, Bailey M, Jeynes C, Gundogdu O, Bradley DA. (2010) 'Elemental and structural studies at the bone-cartilage interface'. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 652 (1), pp. 786-790.
doi: 10.1016/j.nima.2010.09.095
Bailey M. (2010) 'Surface analysis techniques in forensic science'. Surface and Interface Analysis, 42 (5), pp. 339-340.
doi: 10.1002/sia.3322
Bailey MJ, Coe S, Grant DM, Grime GW, Jeynes C. (2009) 'Accurate determination of the Ca : P ratio in rough hydroxyapatite samples by SEM-EDS, PIXE and RBS - a comparative study'. JOHN WILEY & SONS LTD X-RAY SPECTROMETRY, Cavtat, CROATIA: 38 (4), pp. 343-347.
doi: 10.1002/xrs.1171
Bailey MJ, Jeynes C. (2009) 'Characterisation of gunshot residue particles using self-consistent ion beam analysis'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Debrecen, HUNGARY: 267 (12-13), pp. 2265-2268.
doi: 10.1016/j.nimb.2009.03.031
Bailey MJ, Howard KT, Kirkby KJ, Jeynes C. (2009) 'Characterisation of inhomogeneous inclusions in Darwin glass using ion beam analysis'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Debrecen, HUNGARY: 267 (12-13), pp. 2219-2224.
doi: 10.1016/j.nimb.2009.03.013
Hashim S, Al-Ahbabi S, Bradley DA, Webb M, Jeynes C, Ramli AT, Wagiran H. (2009) 'The thermoluminescence response of doped SiO2 optical fibres subjected to photon and electron irradiations'. PERGAMON-ELSEVIER SCIENCE LTD APPLIED RADIATION AND ISOTOPES, 67 (3), pp. 423-427.
doi: 10.1016/j.apradiso.2008.06.030
Kaabar W, Daar E, Gundogdu O, Jenneson PM, Farquharson MJ, Webb M, Jeynes C, Bradley DA. (2009) 'Metal deposition at the bone-cartilage interface in articular cartilage'. PERGAMON-ELSEVIER SCIENCE LTD APPLIED RADIATION AND ISOTOPES, 67 (3), pp. 475-479.
doi: 10.1016/j.apradiso.2008.06.019
Jeynes JCG, Webb M, Kirkby KJ, Kirkby NF, Bradley DA. (2009) 'Proceedings of the First International Conference on Biomedical Applications of High Energy Ion Beams Preface'. PERGAMON-ELSEVIER SCIENCE LTD APPLIED RADIATION AND ISOTOPES, 67 (3), pp. 369-370.
doi: 10.1016/j.apradiso.2008.06.011
Perusko D, Webb MJ, Milinovic V, Timotijevic B, Miosavljevic M, Jeynes C, Webb RP. (2008) 'On the ion irradiation stability of Al/Ti versus AlN/TiN multilayers'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Hyderabad, Sch Phys, Hyderabad, INDIA: 266 (8), pp. 1749-1753.
doi: 10.1016/j.nimb.2008.02.034
Webb M, Jeynes C, Gwilliam R, Royle A, Sealy B. (2006) 'Characterising ion-cut in GaAs by Rutherford backscattering spectroscopy'. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 249 (1-2), pp. 429-431.
doi: 10.1016/j.nimb.2006.04.045

Conference papers

Bradley DA, Kaabar W, Gundogdu O, Farquharson MJ, Janousch M, Bailey M, Jeynes C. (2010) 'Synchrotron and ion beam studies of the bone-cartilage interface'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, Melbourne, AUSTRALIA: 11th International Symposium on Radiation Physics 619 (1-3), pp. 330-337.
doi: 10.1016/j.nima.2009.10.142
Jeynes JCG, Bailey MJ, Coley H, Kirkby KJ, Jeynes C. (2010) 'Microbeam PIXE analysis of platinum resistant and sensitive ovarian cancer cells'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Cambridge, Cambridge, ENGLAND: 19th International Conference on Ion Beam Analysis 268 (11-12), pp. 2168-2171.
doi: 10.1016/j.nimb.2010.02.042
Bailey MJ, Jeynes C, Sealy BJ, Webb RP, Gwilliam RM. (2010) 'On artefacts in the secondary ion mass spectrometry profiling of high fluence H+ implants in GaAs'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Cambridge, Cambridge, ENGLAND: 19th International Conference on Ion Beam Analysis 268 (11-12), pp. 2051-2055.
doi: 10.1016/j.nimb.2010.02.033
Bailey MJ, Jones BN, Hinder S, Watts J, Bleay S, Webb RP. (2010) 'Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Univ Cambridge, Cambridge, ENGLAND: 19th International Conference on Ion Beam Analysis 268 (11-12), pp. 1929-1932.
doi: 10.1016/j.nimb.2010.02.104
Bradley DA, Farquharson MJ, Gundogdu O, Al-Ebraheem A, Ismail EC, Kaabar W, Bunk O, Pfeiffer F, Falkenberge G, Bailey M. (2010) 'Applications of condensed matter understanding to medical tissues and disease progression: Elemental analysis and structural integrity of tissue scaffolds'. PERGAMON-ELSEVIER SCIENCE LTD RADIATION PHYSICS AND CHEMISTRY, Parkville, AUSTRALIA: International Forum on Future Directions in Atomic and Condensed Matter Research and Applications 79 (2), pp. 162-175.
doi: 10.1016/j.radphyschem.2008.12.007
Webb R, Bailey M, Jeynes C, Grime G. (2010) '19th International Conference on Ion Beam Analysis'. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 268 (11-12)
doi: 10.1016/j.nimb.2010.04.016
Peng N, Jeynes C, Bailey MJ, Adikaari D, Stolojan V, Webb RP. (2009) 'High concentration Mn ion implantation in Si'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Dresden, GERMANY: 16th International Conference on Ion Beam Modification of Materials 267 (8-9), pp. 1623-1625.
doi: 10.1016/j.nimb.2009.01.065
Bailey MJ, Kirkby KJ, Jeynes C. (2009) 'Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study'. JOHN WILEY & SONS LTD X-RAY SPECTROMETRY, Cavtat, CROATIA: 13th European X-Ray Spectrometry Conference (EXRS 2008) 38 (3), pp. 190-194.
doi: 10.1002/xrs.1142
Jeynes C, Bailey MJ, Peng N, Zoppi G, Forbes I. (2009) 'Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis'. 1st International Conference on Sustainable Power Generation and Supply, SUPERGEN '09,
doi: 10.1109/SUPERGEN.2009.5348162
Full text is available at: http://epubs.surrey.ac.uk/715434/

Abstract

There are many technical challenges in the fabrication of devices from novel materials. The characterization of these materials is critical in the development of efficient photovoltaic systems. We show how the application of recent advances in MeV IBA, providing the self-consistent treatment of RBS (Rutherford backscattering) and PIXE (particle induced X-ray emission) spectra, makes a new set of powerful complementary depth profiling techniques available for all thin film technologies, including the chalcopyrite compound semiconductors. We will give and discuss a detailed analysis of a CuInAl metallic precursor film, showing how similar methods are also applicable to other films of interest.
Webb M, Jeynes C, Gwilliam R, Too P, Kozanecki A, Domagala J, Royle A, Sealy B. (2005) 'The influence of the ion implantation temperature and the dose rate on smart-cut (c) in GaAs'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Natl Museum Folk Arts & Tradit, Paris, FRANCE: 8th European Conference on Accelerators in Applied Research and Technology 240 (1-2), pp. 142-145.
doi: 10.1016/j.nimb.2005.06.104
Webb M, Jeynes C, Gwilliam RM, Tabatabaian Z, Royle A, Sealy BJ. (2005) 'The influence of the ion implantation temperature and the flux on smart-cut (c) in GaAs'. ELSEVIER SCIENCE BV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Taipei, TAIWAN: 15th International Conference on Ion Implantation Technology 237 (1-2), pp. 193-196.
doi: 10.1016/j.nimb.2005.04.100

Teaching

Dr Bailey teaches on Levels 1 and 2 Analytical Chemistry (CHE 1030 and 2030), Levels 1 and 2 Forensic Science (CHE 1033 and CHE 2033), Research Skills CHRM002 and Level 1 Fundamental Tier Mathematics (CHE 1037). She is also module coordinator for Level 3 Forensic Toxicology BMS 3012.

Departmental Duties

Co-ordinator of postgraduate seminar series (Summer 2012 onwards)