Surface Analysis - An Introduction to XPS, SIMS and Scanning Auger Microscopy
Friday 25 April 2008
The Faculty of Engineering and Physical Sciences at the University of Surrey cordially invites students and professionals to attend the course ‘Surface Analysis: XPS, Auger and SIMS' to be held at the University of Surrey, between 27 April to 1 May 2009.
This Surface Analysis: XPS, Auger and SIMS course provides an intensive introduction to the techniques of X-ray Photoelectron Spectroscopy (XPS or ESCA) and Auger Electron Spectroscopy (AES), together with Scanning Auger Microscopy (SAM) and Secondary Ion Mass Spectrometry (SIMS).
The Surface Analysis: XPS, Auger and SIMS course aims to:
- introduce the techniques of X-ray Photoelectron Spectroscopy, Scanning Auger Microscopy and Secondary Ion Mass Spectrometry
- give an understanding of the theory underlying these techniques
- familiarise students with the equipment
- indicate the possibilities and also the drawbacks of these different methods of analysis
On successful completion of the course, learners will be able to:
- understand the theory and practice of the surface analytical techniques of XPS, Auger and SIMS,
- appreciate the scope and limitations of each technique
- be able to indicate which techniques are applicable in given circumstances understand the interpretation of the results
For more information please contact Tamzin Greggs, Tel: 01483 689378 or Web: http://sits.surrey.ac.uk/live/ipo/engm117-0001.htm
Media Enquiries
Peter La, Press Office at the University of Surrey, Tel: +44 (0)1483 689191, or Email mediarelations@surrey.ac.uk