The Surface Analysis Laboratory
Overview
The Surface Analysis Laboratory (SAL) at the University of Surrey contains the most complete cluster of surface analysis instrumentation for X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning Auger microscopy (SAM) and scanning probe microscopy (SPM) certainly in Europe, and perhaps in the world. The installed capital value of this instrumentation is of the order of £3M and new state-of-the-art instruments for scanning Auger microscopy and X-ray photoelectron spectroscopy have recently been installed. We have been fortunate in being able to re-equip in all our technologies in the last five years.
The SAL works in close collaboration with the MicroStructural Studies Unit at the University of Surrey. A combination of state-of-the-art instrumentation, expertise in data interpretation and materials knowledge enables experienced academics and technical staff to select the right combination of techniques for undertaking materials related R&D or solving technical problems. Such work includes product development, failure analysis, process problems, surface contaminants, verification of material composition etc. The surface analytical instrumentation and expertise of the SAL staff are offered to industry and academia for involvement in research projects or problem solving on a daily pro-rata basis.
Instrumentation
Theta Probe
A state-of-the-art small spot (15 µm) XPS instrument with a monochromated X-ray source and Ar ion gun for depth profiling. Excellent spatial resolution, sensitivity and energy resolution. The instrument has parallel angle resolved XPS (PARXPS) capability enabling the acquisition of non-destructive depth profiles. The instrument now includes a preparation chamber which may be used for a range of in-situ and in-vacuo experiments and sample preparation procedures.
Microlab 350
A high spatial resolution (12 nm) Scanning Auger Microscope with simultaneous EDX analysis. XPS and BSE facilities are also available on this multi-technique instrument. The instrument includes a preparation chamber which may be used for a range of in-situ and in-vacuo experiments and sample preparation procedures, including a fracture stage for metal and composite samples.
TOF.SIMS5
A high spatial and mass resolution ToF-SIMS instrument incorporating a polyatomic Bi ion source. Additional Cs and C60 ion sources are installed on this instrument as depth profiling etch sources although they may also be employed as analysis sources. The instrument includes a preparation chamber which may be used for a range of in-situ and in-vacuo experiments and sample preparation procedures. In-situ stages for impact and controlled strain rate testing of materials are currently installed on the preparation chamber. The instrument also possesses heating and cooling stages in the entry lock and analysis chamber.
ESCALAB Mk II
Standard, large area XPS instrument equipped with an XR4 twin anode X-ray source, an Alpha 110 analyzer and an Ar ion gun for sample etching. The instrument includes a sample preparation chamber which may be used for a range of in-situ and in-vacuo experiments and sample preparation procedures. UPS spectroscopy is also available on this instrument.
Scanning Probe Microscopy
The ‘Solver’ is a novel stand-alone SPM capable of studying samples of unlimited size and thickness. The Nanoscope III is a system used for fundamental studies and in-situ experiments both in air and in liquids. A 'Solver' magnetic force microscopy (MFM) instrument capable of being used under ambient or in-vacuo conditions is also available.