Consulting and external work
Surface analysis techniques can be used to solve problems in a huge range of areas, some of which are listed below:
- Adhesive failure analysis/delamination
- Identification of surface contamination
- Assessment of cleaning procedures
- Elemental composition – bulk and surface
- Chemical state information
- Material identification and verification
- Micro or nano particle analysis
- Thin film analysis
- Metal passivation and corrosion
- Grain boundary segregation in metals
- Surface segregation
- Protective coatings and paints
- Identification of stains and discolorations
- Polymer surface functionality before and after various treatments
- Oxide film thickness
- Surface ultra-thin film thickness
- Depth profiles of thin film components
- Defect identification
- Molecular identification of lubricants, additives, and contaminants
Each new investigation will be discussed with the laboratory manager and an appropriate member of staff with extensive experience in the relevant field. There will be no cost involved in this initial discussion.
The laboratory staff will always be clear about our capability, facilities, analysis timescale and the results you can expect from the analysis. If it is decided to go ahead with an investigation a description of the proposed work and a detailed quote will be sent to you for approval.
Each problem is unique and as such the cost of analysis varies, our fees vary depending upon: the analysis techniques required, the level of analysis or information required, the difficulty of sample preparation, sample type and sample number. For example, the analysis of metallic samples in XPS where a surface composition is only required without any chemical state information can be completed faster and more easily than the analysis of insulators where chemical state information is desired.
Another example with varying costs is analysis in our Auger microscope, the elemental composition of a nanoparticle can be obtained far faster than the composition of a fracture interface fractured in vacuo.