Listed below are the instruments we have here at the University. If you are interested in having a sample analysed, then please fill out our enquiries form.
The JEOL JSM-7100F is a highly versatile, easy- to-use analytical field emission SEM with a spatial resolution of 1.2 nm at 30 kV. The MSSU microscope is fitted with a Thermo Scientific triple analysis system, featuring an UltraDry EDS detector, a MagnaRay parallel beam WDS spectrometer and a QuasOr system for electron backscattered diffraction (EBSD).
All three analytical functions are integrated into a single Noran System 7 data system to allow integration between three complementary techniques.
Hitachi HD2300A STEM
The HD2300A STEM is a high performance FEG-STEM with a point resolution of 0.2 nm. The instrument is equipped with X-ray analysis (EDX) and parallel EELS (low atomic number and chemical state) spectroscopy and imaging facilities.
Philips CM200 TEM
The Philips CM200 transmission electron microscope (TEM) operating at up to 200 kV is a very versatile microscope. The computer controlled eucentric sample holder can tilt from -45º to +45º along the A axis and -30º to +30º along the B axis making it ideal for diffraction work.
The CM200 can also achieve a line resolution of 0.14nm with the same holder, as good as a dedicated HRTEM. Furthermore the attached ultra-thin window EDX detector and Electron Energy Loss Spectrometer (EELS) make the CM200 a true analytical microscope.
Hitachi S4000 SEM
The Hitachi S4000 SEM is a high resolution microscope with a cold cathode field emission electron source (FESEM). This SEM also has a solid state backscattered electron detector for atomic contrast imaging.
It's ease of use and high resolution makes this a very versatile instrument for many users’ applications, complimenting the other microscopes available in the MSSU.
Hitachi S3200N SEM
The HITACHI S3200N is our most versatile instrument. It has a large specimen chamber, a back scattered electron detector and a variable pressure mode (VP-SEM) allowing the examination of non-conducting and ‘wet’ samples with no special sample preparation.
Combined with an ultra-thin window Energy Dispersive X-ray (EDX) detector for qualitative/ quantitative elemental analysis, this SEM is a workhorse for investigating all manner of problematic samples, helping our clients find solutions to their problems and enabling students to produce high quality results in all fields of science and technology.
Get in contact
If you have an enquiry or would like us to analyse a sample of material, then please fill out our enquiries form and we will get back to you.