Instrumentation

Theta probe

A state-of-the-art small spot (15 µm) XPS instrument with a monochromated X-ray source and Ar ion gun for depth profiling. Excellent spatial resolution, sensitivity and energy resolution.

The instrument has parallel angle resolved XPS (PARXPS) capability enabling the acquisition of non-destructive depth profiles. The instrument now includes a preparation chamber which may be used for a range of in-situ and in-vacuo experiments and sample preparation procedures.

Microlab 350

A high spatial resolution (12 nm) Scanning Auger Microscope with simultaneous EDX analysis. XPS and BSE facilities are also available on this multi-technique instrument.

The instrument includes a preparation chamber which may be used for a range of in-situ and in-vacuo experiments and sample preparation procedures, including a fracture stage for metal and composite samples.

TOF.SIMS5

A high spatial and mass resolution ToF-SIMS instrument incorporating a polyatomic Bi ion source. Additional Cs and C60 ion sources are installed on this instrument as depth profiling etch sources although they may also be employed as analysis sources.

The instrument includes a preparation chamber which may be used for a range of in-situ and in-vacuo experiments and sample preparation procedures. In-situ stages for impact and controlled strain rate testing of materials are currently installed on the preparation chamber. The instrument also possesses heating and cooling stages in the entry lock and analysis chamber.

ESCALAB Mk II

Standard, large area XPS instrument equipped with an XR4 twin anode X-ray source, an Alpha 110 analyzer and an Ar ion gun for sample etching. The instrument includes a sample preparation chamber which may be used for a range of in-situ and in-vacuo experiments and sample preparation procedures. UPS spectroscopy is also available on this instrument.

Scanning probe microscopy

The Laboratory has been active in SPM since 1992 and has recently installed a Bruker Dimension Edge AFM system (illustrated) with PeakForce tapping mode and Kelvin Probe capabilities.

Two older systems are available for more specialised applications; the Nanoscope III (Multimode) is a system used for fundamental studies and in-situ electrochemical experiments, both in air and in liquids, and a MDT Solver with magnetic force microscopy (MFM) facilities as well as conventional AFM capable of being used under ambient or in-vacuo conditions.

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