Large-area microwave and RF devices and circuits
To fully realize the promise of flexible, ink-jet-printed electronics for RF and microwave applications, there is a need for robust metrology to characterize the inks and the circuits that are fabricated.
In our laboratories and with our partners we have the capability of performing high-accuracy, with uncertainties, of calibrated measurements of inkjet printed circuits. At the University of Surrey this is supported in our new nonlinear microwave measurement and modelling laboratory, which is backed by a £2M Strategic Equipment Grant from EPSRC.
- National Physical Laboratories, Teddington, UK
- Department of Electrical Engineering and Computer Science, The University of Toledo, USA
- Institute of Electronic Systems, Warsaw University of Technology, Warsaw, Poland
- National Institute of Standards and Technology Boulder, Colorado, USA.
A. Sahu, V. Devabhaktuni, A. Lewandowski, P. Barmuta, T. M. Wallis, M. Shkunov, and P. H. Aaen, “Microwave Characterization of Ink-Jet Printed CPW on PET Substrates”, accepted for publication at the upcoming 86th ARFTG Microwave Measurement Conference, Dec 1-4th, 2015.