Large-area microwave and RF devices and circuits

To fully realize the promise of flexible, ink-jet-printed electronics for RF and microwave applications, there is a need for robust metrology to characterize the inks and the circuits that are fabricated.

In our laboratories and with our partners we have the capability of performing high-accuracy, with uncertainties, of calibrated measurements of inkjet printed circuits. At the University of Surrey this is supported in our new nonlinear microwave measurement and modelling laboratory, which is backed by a £2M Strategic Equipment Grant from EPSRC.

Partner institutes

  • National Physical Laboratories, Teddington, UK
  • Department of Electrical Engineering and Computer Science, The University of Toledo, USA
  • Institute of Electronic Systems, Warsaw University of Technology, Warsaw, Poland
  • National Institute of Standards and Technology Boulder, Colorado, USA.

Recent publications

A. Sahu, V. Devabhaktuni, A. Lewandowski, P. Barmuta, T. M. Wallis, M. Shkunov, and P. H. Aaen, “Microwave Characterization of Ink-Jet Printed CPW on PET Substrates”, accepted for publication at the upcoming 86th ARFTG Microwave Measurement Conference,  Dec 1-4th, 2015.

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Nanoelectronics Centre
Advanced Technology Institute
University of Surrey