About
My research project
Optimisation of Ion Beam Analysis techniquesAnalysis of semiconductors using Ion Beam analysis (IBA) techniques such as: Time of Flight Elastic Recoil Detection (TOF-ERD) and Rutherford Backscattering Spectrometry (RBS).
Supervisors
Analysis of semiconductors using Ion Beam analysis (IBA) techniques such as: Time of Flight Elastic Recoil Detection (TOF-ERD) and Rutherford Backscattering Spectrometry (RBS).