![Jeevan Dulai](/sites/default/files/styles/diamond_shape_250x250/public/2021-12/jeevan-dulai.jpg?itok=H8hQwAUK)
Jeevan Dulai
Postgraduate Research Student
Academic and research departments
About
My research project
Optimisation of Ion Beam Analysis techniquesAnalysis of semiconductors using Ion Beam analysis (IBA) techniques such as: Time of Flight Elastic Recoil Detection (TOF-ERD) and Rutherford Backscattering Spectrometry (RBS).
Supervisors
Analysis of semiconductors using Ion Beam analysis (IBA) techniques such as: Time of Flight Elastic Recoil Detection (TOF-ERD) and Rutherford Backscattering Spectrometry (RBS).