Large-area microwave and RF devices and circuits
To fully realise the promise of flexible, ink-jet-printed electronics for radio frequency and microwave applications, there is a need for robust metrology to characterise the inks and the circuits that are fabricated.
In our laboratories and with our partners we have the capability of performing high-accuracy, with uncertainties, of calibrated measurements of inkjet printed circuits. Here at the University of Surrey this is supported in our new nonlinear microwave measurement and modelling laboratory, which is backed by a £2M Strategic Equipment Grant from EPSRC.
- National Physical Laboratories, Teddington, UK
- Department of Electrical Engineering and Computer Science, The University of Toledo, USA
- Institute of Electronic Systems, Warsaw University of Technology, Warsaw, Poland
- National Institute of Standards and Technology Boulder, Colorado, USA.
A. Sahu, V. Devabhaktuni, A. Lewandowski, P. Barmuta, T. M. Wallis, M. Shkunov, and P. H. Aaen, “Microwave Characterization of Ink-Jet Printed CPW on PET Substrates”, accepted for publication at the 86th ARFTG Microwave Measurement Conference, 1 - 4 December, 2015.